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SctData Namespace Reference

The namespace containing the objects needed to publish and refresh the data objects to and from IS. More...


Data Structures

class  CachedFunction1D
 Caches the values of a 1-d function into a look-up table so that it can later be evaluated very quickly. More...

class  CalChargeVariable
class  ChipConfiguration
 This class represents the configuration of a chip. More...

class  ChipNOResult
 small class holds all data relevant to one chip. More...

class  ConfigurationVariable
 ConfigurationVariable represents a variable within ModuleConfiguration/ABCDModule. More...

class  ConfigurationVariableIOHelper
class  DcsData
 Class intended to hold the DCS data coming from a module, so that it can be archived along with test results etc. More...

class  DefaultVariable
 This class represents a configuration variable for which there is no specific class. More...

class  Defect
 Represents a defect - basically a union of a ModuleElement and a DefectPrototype. More...

class  DefectIOHelper
class  DefectList
 This class represents all the defects in a module. More...

class  DefectPrototype
 Prototypes for making Defect s out of. More...

class  ErfcFitObject
 A derived class of the FitObject class of complimentary error function. More...

class  ErfFitObject
class  ExponentialResponseCurve
 This class represents the normal exponential fit to the response curve. More...

class  FitObject
 FitObject is an abstract base class fit object to store the output to various types of fit. More...

class  FitScanResult
 Class for the various fitted ROD scan result objects. More...

class  FitScanResultIOHelper
class  FullBypassTestResult
 The class represents the result of a pipeline test. More...

class  FullBypassTestResult::ChipFBResult
class  GausFitObject
 A derrived class of the FitObject class of gausian form f = [0] * exp( 0.5 * ( (x-[1])/[2] )**2 ) Parameters: [0] is the prefactor; [1] is the mean; [2] is the standard deviation;. More...

class  GrilloResponseCurve
 The fit function as suggested by Alex Grillo. More...

class  LinearResponseCurve
 This class represents a linear fit to the response curve. More...

class  ModuleConfiguration
 Represents the configuration of a module. More...

class  ModuleElement
 Represents an contiguous element of a module : may be a chip, link or channel. More...

class  mVCalChargeVariable
class  mVfromTrimTargetThresholdVariable
class  mVThresholdVariable
class  NMaskTestResult
 The class represents the result of a NMask test. More...

class  NoiseOccupancyTestResult
 The class represents the Noise Occupancy test. More...

class  NPtGainTestResult
 This class represents the result of doing either a 3 pt Gain Test or a Response Curve Test. More...

class  NPtGainTestResultData
 Holds the result of the fit for each channel Used shared_ptr to allow this to be stored in stl containers. More...

class  NullVariable
 A null ConfigurationVariable - used when eg a Test has only 1 scan in it. More...

class  ObjectPool
 This class is an object pool. More...

class  OccupancyProjector
 Altorithms for projecting TH1 occupancy histograms out of a RawScanResult. More...

class  PipelineTestResult
 The class represents the result of a pipeline test. More...

class  QuadraticResponseCurve
 A quadratic fit. More...

class  RawDataWriter
 Writes data in RAW format, also SLICECOMPRESSED. More...

class  RawScanResult
 A RawScanResult represents the raw data for a single scan. More...

class  RawScanResultIOHelper
class  ResponseCurve
 This interface represents the user selectable mode for fitting an N Pt Gain curve. More...

class  ResponseCurveMap
 Map used within the virtual constructor idiom. More...

class  Result
 This class is an interface for a result which has a ResultHeader. More...

class  ResultHeader
 This class contains the identifying information about a scan result. More...

class  RootStreamableAdapter
class  RxDelayTestResult
 A derived class of TestResult, containing the results data for a Rx Delay Test. More...

class  RxThresholdTestResult
 A derived class of TestResult, containing the results data for a Rx Threshold Test. More...

class  ScanDataWriter
 writes scan_result_ptrs into OStream More...

class  ScanPoints
 This class represents the points in a scan. More...

class  ScanPoints::ScanPoint
 internal class holds data, one per point More...

class  ScanResult
 This class represents all possible things what might come out of a ROD. More...

class  ScanResultWriter
 A Streamer for writing ScanResults from ROD memory chunks. More...

class  ScanWriterFactory
class  SerializableWrapper
 Wraps pointers as a Serializable for IOManager. More...

class  SingleVariableTestResult
 A derived class of TestResult, containing the results data for a Strobe Delay Test. More...

class  SliceDataWriter
 Writes histogrammed raw data from ROD. More...

class  StandardDefects
 This is a holder class for all the DefectPrototype objects that are used. More...

class  Stat
 Represents an individual statistic. More...

class  Stats
 holds lots of Stat<T> objects, and has useful functions More...

class  StrobeDelayTestResult
 A derived class of TestResult, containing the results data for a Strobe Delay Test. More...

class  StrobeDelayVariable
class  TestResult
 This class is the Abstract Base Class for all TestResults. More...

class  TestResult::ScanData
 small internal class contains all the data relevant to a particular scan. More...

class  ThresholdVariable
class  TimeWalkTestResult
 The class represents the result of a pipeline test. More...

class  TimeWalkTestResult::ChipTWResult
class  TopHatFitObject
 A fit function designed for use in, for example, the strobe-delay scan. More...

class  TrimRangeTestResult
 Holds the results of the trim range test. More...

class  TrimRangeTestResult::ChipTrim
 The whole trim setting for a chip at a particular trim target. More...

class  TrimRangeTestResult::ChipTrimData
 Represents all the data for a single chip and a single trim range. More...

class  TrimRangeTestResult::Trim
 Represents the trim setting for an individual channel for a particular trim target. More...

class  TrimRangeTestResult::TrimData
 Contains (representation of a) graph of TrimDAQ against target, and fitparameters, p0, and p1, such that trim=(int) p0 + target * p1. More...

class  UniqueID
 This is a simple class to facilitate constructing and parsing uniqueIDs. More...


Fit Functions

declaration of functions used by ROOT TF1 for evaluating our FitObject subclasses.

Double_t erf (Double_t *x, Double_t *par) throw ()
 Calculate the parameterized erf funtion.

Double_t erfc (Double_t *x, Double_t *par) throw ()
 Calculate the parameterized erfc funtion.

Double_t tophat (Double_t *x, Double_t *par) throw ()
 Calculate the smeared tophat function.


Enumerations

enum  DefectSeverity { NONE, DODGY, SERIOUS, UNUSEABLE }
 Describes how severe defects are. More...


Functions

CachedFunction1DgetErfCache () throw ()
Double_t erf (double *x, double *par) throw ()
Double_t erfc (double *x, double *par) throw ()
Double_t tophat (double *x, double *par) throw ()
ostream & operator<< (ostream &os, const SctData::FitObject &f) throw (LogicError)
double lnerfc (double *x, double *par)

Variables

const mVCalChargeVariable & ob
const NullVariable::NullVariable & nv


Detailed Description

The namespace containing the objects needed to publish and refresh the data objects to and from IS.

It forms a library which is used by client programs. Examples are the fitting service and the analysis service.

A brief overview of the structure

Here is a UML diagram giving an overview of the structure.

SctData_c++.gif
The principal classes go down the middle, they are ScanResult and its sub-classes: RawScanResult and FitScanResult, and TestResult and its sub-classes. Classes used by these principal classes are shown as satellites around them.


Enumeration Type Documentation

enum SctData::DefectSeverity
 

Describes how severe defects are.

Enumeration values:
NONE  Used to indicate that there is no defect associated with the ModuleElement - should not be used for DefectPrototypes.
DODGY  ModuleElements affected by this defect should not have any special action taken.
SERIOUS  ModuleElements affected by this defect should be excluded when determining parameters (e.g. trim range).
UNUSEABLE  ModuleElements affected by this defect are unuseable and should be masked.

Definition at line 15 of file DefectPrototype.h.

Referenced by SctAnalysis::StrobeDelayAlgorithm::analyze(), SctData::DefectList::defectSeverityAffectingElement(), SctData::DefectList::defectSeverityEncompassingElement(), SctData::OccupancyProjector::getOccupancy(), and SctData::DefectPrototype::getSeverity().


Function Documentation

Double_t erf Double_t *  x,
Double_t *  par
throw ()
 

Calculate the parameterized erf funtion.

Double_t erfc Double_t *  x,
Double_t *  par
throw ()
 

Calculate the parameterized erfc funtion.

Double_t tophat Double_t *  x,
Double_t *  par
throw ()
 

Calculate the smeared tophat function.

I.e. paramterized erf*erfc


Generated on Thu Jul 15 09:52:32 2004 for SCT DAQ/DCS Software - C++ by doxygen 1.3.5