SctData::StandardDefects Class Reference

This is a holder class for all the DefectPrototype objects that are used. More...

#include <StandardDefects.h>

Collaboration diagram for SctData::StandardDefects:

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Static Public Attributes
Fit Defects
const DefectPrototype	DEAD
	Output always v small.
const DefectPrototype	STUCKON
	Output always v high.
const DefectPrototype	OVER
	Occupancy larger than max.
const DefectPrototype	UNDER
	Occupancy never reaches mas.
const DefectPrototype	NOINIT
	Couldn't initialize the fit.
const DefectPrototype	BADFIT
	The fit was not good for some reason - parameter is a chi2 cut.
Strobe Delay Defects
const DefectPrototype	SD_LO
	Low edge is not between 0 and 35.
const DefectPrototype	SD_HI
	Low edge is above 63.
NPt Gain Defects
const DefectPrototype	VLO_GAIN
	Gain < 0.3 * chip average.
const DefectPrototype	LO_GAIN
	Gain < 0.75 * chip average.
const DefectPrototype	HI_GAIN
	Gain > 1.25 * chip average.
const DefectPrototype	LO_OFFSET
	Offset < -100.
const DefectPrototype	HI_OFFSET
	Offset > 120.
const DefectPrototype	UNBONDED
	Noise <= 750.
const DefectPrototype	PARTBONDED
	Noise <= 1100.
const DefectPrototype	NOISY
	Noise > 1.15* av chip noise.
const DefectPrototype	V_NOISY
	Noise > 1.25* av chip noise.
Trim Defects
const DefectPrototype	TR_RANGE
	Unexpected chip trim step size.
const DefectPrototype	TR_STEP
	Channel step different from chip.
const DefectPrototype	TR_OFFSET
	Channel offset different from chip.
const DefectPrototype	TR_NOTRIM
	Untrimmable channel.
const DefectPrototype	NO_HI
	Other defects.
const DefectPrototype	MEAN_ERROR
	high noise occupancy
const DefectPrototype	SIG_ERROR
	Other defects.
const DefectPrototype	STUCK_CELL
	pipeline
const DefectPrototype	DEAD_CELL
	pipeline
const DefectPrototype	TOKEN
	full bypass token
const DefectPrototype	RTOKEN
	full bypass token
const DefectPrototype	TW_HI
	time walk too big
const DefectPrototype	TW_LO
	time walk too small

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Detailed Description

This is a holder class for all the DefectPrototype objects that are used.

Author:

Matthew Palmer

Definition at line 13 of file StandardDefects.h.

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Field Documentation

const DefectPrototype SctData::StandardDefects::BADFIT [static]

The fit was not good for some reason - parameter is a chi2 cut.

const DefectPrototype SctData::StandardDefects::DEAD [static]

Output always v small.

const DefectPrototype SctData::StandardDefects::DEAD_CELL [static]

pipeline

const DefectPrototype SctData::StandardDefects::HI_GAIN [static]

Gain > 1.25 * chip average.

const DefectPrototype SctData::StandardDefects::HI_OFFSET [static]

Offset > 120.

const DefectPrototype SctData::StandardDefects::LO_GAIN [static]

Gain < 0.75 * chip average.

const DefectPrototype SctData::StandardDefects::LO_OFFSET [static]

Offset < -100.

const DefectPrototype SctData::StandardDefects::MEAN_ERROR [static]

high noise occupancy

const DefectPrototype SctData::StandardDefects::NO_HI [static]

Other defects.

const DefectPrototype SctData::StandardDefects::NOINIT [static]

Couldn't initialize the fit.

const DefectPrototype SctData::StandardDefects::NOISY [static]

Noise > 1.15* av chip noise.

const DefectPrototype SctData::StandardDefects::OVER [static]

Occupancy larger than max.

const DefectPrototype SctData::StandardDefects::PARTBONDED [static]

Noise <= 1100.

const DefectPrototype SctData::StandardDefects::RTOKEN [static]

full bypass token

const DefectPrototype SctData::StandardDefects::SD_HI [static]

Low edge is above 63.

const DefectPrototype SctData::StandardDefects::SD_LO [static]

Low edge is not between 0 and 35.

const DefectPrototype SctData::StandardDefects::SIG_ERROR [static]

Other defects.

const DefectPrototype SctData::StandardDefects::STUCK_CELL [static]

pipeline

const DefectPrototype SctData::StandardDefects::STUCKON [static]

Output always v high.

const DefectPrototype SctData::StandardDefects::TOKEN [static]

full bypass token

const DefectPrototype SctData::StandardDefects::TR_NOTRIM [static]

Untrimmable channel.

const DefectPrototype SctData::StandardDefects::TR_OFFSET [static]

Channel offset different from chip.

const DefectPrototype SctData::StandardDefects::TR_RANGE [static]

Unexpected chip trim step size.

const DefectPrototype SctData::StandardDefects::TR_STEP [static]

Channel step different from chip.

const DefectPrototype SctData::StandardDefects::TW_HI [static]

time walk too big

const DefectPrototype SctData::StandardDefects::TW_LO [static]

time walk too small

const DefectPrototype SctData::StandardDefects::UNBONDED [static]

Noise <= 750.

const DefectPrototype SctData::StandardDefects::UNDER [static]

Occupancy never reaches mas.

const DefectPrototype SctData::StandardDefects::V_NOISY [static]

Noise > 1.25* av chip noise.

const DefectPrototype SctData::StandardDefects::VLO_GAIN [static]

Gain < 0.3 * chip average.

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The documentation for this class was generated from the following files:

• StandardDefects.h
• StandardDefects.cpp

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