SctData Namespace Reference

The namespace containing the objects needed to publish and refresh the data objects to and from IS. More...

Data Structures
class	CachedFunction1D
	Caches the values of a 1-d function into a look-up table so that it can later be evaluated very quickly. More...
class	CalChargeVariable
class	ChipConfiguration
	This class represents the configuration of a chip. More...
class	ChipNOResult
	small class holds all data relevant to one chip. More...
class	ConfigurationVariable
	ConfigurationVariable represents a variable within ModuleConfiguration/ABCDModule. More...
class	ConfigurationVariableIOHelper
class	DcsData
	Class intended to hold the DCS data coming from a module, so that it can be archived along with test results etc. More...
class	DefaultVariable
	This class represents a configuration variable for which there is no specific class. More...
class	Defect
	Represents a defect - basically a union of a ModuleElement and a DefectPrototype. More...
class	DefectIOHelper
class	DefectList
	This class represents all the defects in a module. More...
class	DefectPrototype
	Prototypes for making Defect s out of. More...
class	ErfcFitObject
	A derived class of the FitObject class of complimentary error function. More...
class	ErfFitObject
class	ExponentialResponseCurve
	This class represents the normal exponential fit to the response curve. More...
class	FitObject
	FitObject is an abstract base class fit object to store the output to various types of fit. More...
class	FitScanResult
	Class for the various fitted ROD scan result objects. More...
class	FitScanResultIOHelper
class	FullBypassTestResult
	The class represents the result of a pipeline test. More...
class	FullBypassTestResult::ChipFBResult
class	GausFitObject
	A derrived class of the FitObject class of gausian form f = [0] * exp( 0.5 * ( (x-[1])/[2] )**2 ) Parameters: [0] is the prefactor; [1] is the mean; [2] is the standard deviation;. More...
class	GrilloResponseCurve
	The fit function as suggested by Alex Grillo. More...
class	LinearResponseCurve
	This class represents a linear fit to the response curve. More...
class	ModuleConfiguration
	Represents the configuration of a module. More...
class	ModuleElement
	Represents an contiguous element of a module : may be a chip, link or channel. More...
class	mVCalChargeVariable
class	mVfromTrimTargetThresholdVariable
class	mVThresholdVariable
class	NMaskTestResult
	The class represents the result of a NMask test. More...
class	NoiseOccupancyTestResult
	The class represents the Noise Occupancy test. More...
class	NPtGainTestResult
	This class represents the result of doing either a 3 pt Gain Test or a Response Curve Test. More...
class	NPtGainTestResultData
	Holds the result of the fit for each channel Used shared_ptr to allow this to be stored in stl containers. More...
class	NullVariable
	A null ConfigurationVariable - used when eg a Test has only 1 scan in it. More...
class	ObjectPool
	This class is an object pool. More...
class	OccupancyProjector
	Altorithms for projecting TH1 occupancy histograms out of a RawScanResult. More...
class	PipelineTestResult
	The class represents the result of a pipeline test. More...
class	QuadraticResponseCurve
	A quadratic fit. More...
class	RawDataWriter
	Writes data in RAW format, also SLICECOMPRESSED. More...
class	RawScanResult
	A RawScanResult represents the raw data for a single scan. More...
class	RawScanResultIOHelper
class	ResponseCurve
	This interface represents the user selectable mode for fitting an N Pt Gain curve. More...
class	ResponseCurveMap
	Map used within the virtual constructor idiom. More...
class	Result
	This class is an interface for a result which has a ResultHeader. More...
class	ResultHeader
	This class contains the identifying information about a scan result. More...
class	RootStreamableAdapter
class	RxDelayTestResult
	A derived class of TestResult, containing the results data for a Rx Delay Test. More...
class	RxThresholdTestResult
	A derived class of TestResult, containing the results data for a Rx Threshold Test. More...
class	ScanDataWriter
	writes scan_result_ptrs into OStream More...
class	ScanPoints
	This class represents the points in a scan. More...
class	ScanPoints::ScanPoint
	internal class holds data, one per point More...
class	ScanResult
	This class represents all possible things what might come out of a ROD. More...
class	ScanResultWriter
	A Streamer for writing ScanResults from ROD memory chunks. More...
class	ScanWriterFactory
class	SerializableWrapper
	Wraps pointers as a Serializable for IOManager. More...
class	SingleVariableTestResult
	A derived class of TestResult, containing the results data for a Strobe Delay Test. More...
class	SliceDataWriter
	Writes histogrammed raw data from ROD. More...
class	StandardDefects
	This is a holder class for all the DefectPrototype objects that are used. More...
class	Stat
	Represents an individual statistic. More...
class	Stats
	holds lots of Stat<T> objects, and has useful functions More...
class	StrobeDelayTestResult
	A derived class of TestResult, containing the results data for a Strobe Delay Test. More...
class	StrobeDelayVariable
class	TestResult
	This class is the Abstract Base Class for all TestResults. More...
class	TestResult::ScanData
	small internal class contains all the data relevant to a particular scan. More...
class	ThresholdVariable
class	TimeWalkTestResult
	The class represents the result of a pipeline test. More...
class	TimeWalkTestResult::ChipTWResult
class	TopHatFitObject
	A fit function designed for use in, for example, the strobe-delay scan. More...
class	TrimRangeTestResult
	Holds the results of the trim range test. More...
class	TrimRangeTestResult::ChipTrim
	The whole trim setting for a chip at a particular trim target. More...
class	TrimRangeTestResult::ChipTrimData
	Represents all the data for a single chip and a single trim range. More...
class	TrimRangeTestResult::Trim
	Represents the trim setting for an individual channel for a particular trim target. More...
class	TrimRangeTestResult::TrimData
	Contains (representation of a) graph of TrimDAQ against target, and fitparameters, p0, and p1, such that trim=(int) p0 + target * p1. More...
class	UniqueID
	This is a simple class to facilitate constructing and parsing uniqueIDs. More...
Fit Functions
declaration of functions used by ROOT TF1 for evaluating our FitObject subclasses.
Double_t	erf (Double_t *x, Double_t *par) throw ()
	Calculate the parameterized erf funtion.
Double_t	erfc (Double_t *x, Double_t *par) throw ()
	Calculate the parameterized erfc funtion.
Double_t	tophat (Double_t *x, Double_t *par) throw ()
	Calculate the smeared tophat function.
Enumerations
enum	DefectSeverity { NONE, DODGY, SERIOUS, UNUSEABLE }
	Describes how severe defects are. More...
Functions
CachedFunction1D &	getErfCache () throw ()
Double_t	erf (double *x, double *par) throw ()
Double_t	erfc (double *x, double *par) throw ()
Double_t	tophat (double *x, double *par) throw ()
ostream &	operator<< (ostream &os, const SctData::FitObject &f) throw (LogicError)
double	lnerfc (double *x, double *par)
Variables
const mVCalChargeVariable &	ob
const NullVariable::NullVariable &	nv

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Detailed Description

The namespace containing the objects needed to publish and refresh the data objects to and from IS.

It forms a library which is used by client programs. Examples are the fitting service and the analysis service.

A brief overview of the structure

Here is a UML diagram giving an overview of the structure.

The principal classes go down the middle, they are ScanResult and its sub-classes: RawScanResult and FitScanResult, and TestResult and its sub-classes. Classes used by these principal classes are shown as satellites around them.

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Enumeration Type Documentation

enum SctData::DefectSeverity

Describes how severe defects are. Enumeration values: NONE  Used to indicate that there is no defect associated with the ModuleElement - should not be used for DefectPrototypes. DODGY  ModuleElements affected by this defect should not have any special action taken. SERIOUS  ModuleElements affected by this defect should be excluded when determining parameters (e.g. trim range). UNUSEABLE  ModuleElements affected by this defect are unuseable and should be masked. Definition at line 15 of file DefectPrototype.h. Referenced by SctAnalysis::StrobeDelayAlgorithm::analyze(), SctData::DefectList::defectSeverityAffectingElement(), SctData::DefectList::defectSeverityEncompassingElement(), SctData::OccupancyProjector::getOccupancy(), and SctData::DefectPrototype::getSeverity().

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Function Documentation

Double_t erf (  Double_t *  x, Double_t *  par )  throw ()

Calculate the parameterized erf funtion.

Double_t erfc (  Double_t *  x, Double_t *  par )  throw ()

Calculate the parameterized erfc funtion.

Double_t tophat (  Double_t *  x, Double_t *  par )  throw ()

Calculate the smeared tophat function. I.e. paramterized erf*erfc

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