#include <StandardDefects.h>
Collaboration diagram for SctData::StandardDefects:

Static Public Attributes | |
Fit Defects | |
| const DefectPrototype | DEAD |
| Output always v small. | |
| const DefectPrototype | STUCKON |
| Output always v high. | |
| const DefectPrototype | OVER |
| Occupancy larger than max. | |
| const DefectPrototype | UNDER |
| Occupancy never reaches mas. | |
| const DefectPrototype | NOINIT |
| Couldn't initialize the fit. | |
Strobe Delay Defects | |
| const DefectPrototype | SD_LO |
| Low edge is not between 0 and 35. | |
| const DefectPrototype | SD_HI |
| Low edge is above 63. | |
NPt Gain Defects | |
| const DefectPrototype | VLO_GAIN |
| Gain < 0.3 * chip average. | |
| const DefectPrototype | LO_GAIN |
| Gain < 0.75 * chip average. | |
| const DefectPrototype | HI_GAIN |
| Gain > 1.25 * chip average. | |
| const DefectPrototype | LO_OFFSET |
| Offset < -100. | |
| const DefectPrototype | HI_OFFSET |
| Offset > 120. | |
| const DefectPrototype | UNBONDED |
| Noise <= 750. | |
| const DefectPrototype | PARTBONDED |
| Noise <= 1100. | |
| const DefectPrototype | NOISY |
| Noise > 1.15* av chip noise. | |
| const DefectPrototype | V_NOISY |
| Noise > 1.25* av chip noise. | |
Trim Defects | |
| const DefectPrototype | TR_RANGE |
| Unexpected chip trim step size. | |
| const DefectPrototype | TR_STEP |
| Channel step different from chip. | |
| const DefectPrototype | TR_OFFSET |
| Channel offset different from chip. | |
| const DefectPrototype | TR_NOTRIM |
| Untrimmable channel. | |
| const DefectPrototype | NO_HI |
| Other defects. | |
| const DefectPrototype | MEAN_ERROR |
| high noise occupancy | |
| const DefectPrototype | SIG_ERROR |
| Other defects. | |
| const DefectPrototype | STUCK_CELL |
| pipeline | |
| const DefectPrototype | DEAD_CELL |
| pipeline | |
| const DefectPrototype | TOKEN |
| full bypass token | |
| const DefectPrototype | RTOKEN |
| full bypass token | |
| const DefectPrototype | TW_HI |
| time walk too big | |
| const DefectPrototype | TW_LO |
| time walk too small | |
Definition at line 13 of file StandardDefects.h.
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Output always v small.
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pipeline
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Gain > 1.25 * chip average.
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Offset > 120.
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Gain < 0.75 * chip average.
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Offset < -100.
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high noise occupancy
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Other defects.
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Couldn't initialize the fit.
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Noise > 1.15* av chip noise.
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Occupancy larger than max.
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Noise <= 1100.
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full bypass token
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Low edge is above 63.
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Low edge is not between 0 and 35.
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Other defects.
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pipeline
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Output always v high.
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full bypass token
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Untrimmable channel.
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Channel offset different from chip.
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Unexpected chip trim step size.
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Channel step different from chip.
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time walk too big
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time walk too small
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Noise <= 750.
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Occupancy never reaches mas.
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Noise > 1.25* av chip noise.
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Gain < 0.3 * chip average.
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1.3.5