Main Page | Modules | Namespace List | Class Hierarchy | Alphabetical List | Data Structures | File List | Namespace Members | Data Fields | Related Pages

SctData::StandardDefects Class Reference

This is a holder class for all the DefectPrototype objects that are used. More...

#include <StandardDefects.h>

Collaboration diagram for SctData::StandardDefects:

Collaboration graph
[legend]

Static Public Attributes

Fit Defects
const DefectPrototype DEAD
 Output always v small.

const DefectPrototype STUCKON
 Output always v high.

const DefectPrototype OVER
 Occupancy larger than max.

const DefectPrototype UNDER
 Occupancy never reaches mas.

const DefectPrototype NOINIT
 Couldn't initialize the fit.

Strobe Delay Defects
const DefectPrototype SD_LO
 Low edge is not between 0 and 35.

const DefectPrototype SD_HI
 Low edge is above 63.

NPt Gain Defects
const DefectPrototype VLO_GAIN
 Gain < 0.3 * chip average.

const DefectPrototype LO_GAIN
 Gain < 0.75 * chip average.

const DefectPrototype HI_GAIN
 Gain > 1.25 * chip average.

const DefectPrototype LO_OFFSET
 Offset < -100.

const DefectPrototype HI_OFFSET
 Offset > 120.

const DefectPrototype UNBONDED
 Noise <= 750.

const DefectPrototype PARTBONDED
 Noise <= 1100.

const DefectPrototype NOISY
 Noise > 1.15* av chip noise.

const DefectPrototype V_NOISY
 Noise > 1.25* av chip noise.

Trim Defects
const DefectPrototype TR_RANGE
 Unexpected chip trim step size.

const DefectPrototype TR_STEP
 Channel step different from chip.

const DefectPrototype TR_OFFSET
 Channel offset different from chip.

const DefectPrototype TR_NOTRIM
 Untrimmable channel.

const DefectPrototype NO_HI
 Other defects.

const DefectPrototype MEAN_ERROR
 high noise occupancy

const DefectPrototype SIG_ERROR
 Other defects.

const DefectPrototype STUCK_CELL
 pipeline

const DefectPrototype DEAD_CELL
 pipeline

const DefectPrototype TOKEN
 full bypass token

const DefectPrototype RTOKEN
 full bypass token

const DefectPrototype TW_HI
 time walk too big

const DefectPrototype TW_LO
 time walk too small


Detailed Description

This is a holder class for all the DefectPrototype objects that are used.

Author:
Matthew Palmer

Definition at line 13 of file StandardDefects.h.


Field Documentation

const DefectPrototype SctData::StandardDefects::DEAD [static]
 

Output always v small.

const DefectPrototype SctData::StandardDefects::DEAD_CELL [static]
 

pipeline

const DefectPrototype SctData::StandardDefects::HI_GAIN [static]
 

Gain > 1.25 * chip average.

const DefectPrototype SctData::StandardDefects::HI_OFFSET [static]
 

Offset > 120.

const DefectPrototype SctData::StandardDefects::LO_GAIN [static]
 

Gain < 0.75 * chip average.

const DefectPrototype SctData::StandardDefects::LO_OFFSET [static]
 

Offset < -100.

const DefectPrototype SctData::StandardDefects::MEAN_ERROR [static]
 

high noise occupancy

const DefectPrototype SctData::StandardDefects::NO_HI [static]
 

Other defects.

const DefectPrototype SctData::StandardDefects::NOINIT [static]
 

Couldn't initialize the fit.

const DefectPrototype SctData::StandardDefects::NOISY [static]
 

Noise > 1.15* av chip noise.

const DefectPrototype SctData::StandardDefects::OVER [static]
 

Occupancy larger than max.

const DefectPrototype SctData::StandardDefects::PARTBONDED [static]
 

Noise <= 1100.

const DefectPrototype SctData::StandardDefects::RTOKEN [static]
 

full bypass token

const DefectPrototype SctData::StandardDefects::SD_HI [static]
 

Low edge is above 63.

const DefectPrototype SctData::StandardDefects::SD_LO [static]
 

Low edge is not between 0 and 35.

const DefectPrototype SctData::StandardDefects::SIG_ERROR [static]
 

Other defects.

const DefectPrototype SctData::StandardDefects::STUCK_CELL [static]
 

pipeline

const DefectPrototype SctData::StandardDefects::STUCKON [static]
 

Output always v high.

const DefectPrototype SctData::StandardDefects::TOKEN [static]
 

full bypass token

const DefectPrototype SctData::StandardDefects::TR_NOTRIM [static]
 

Untrimmable channel.

const DefectPrototype SctData::StandardDefects::TR_OFFSET [static]
 

Channel offset different from chip.

const DefectPrototype SctData::StandardDefects::TR_RANGE [static]
 

Unexpected chip trim step size.

const DefectPrototype SctData::StandardDefects::TR_STEP [static]
 

Channel step different from chip.

const DefectPrototype SctData::StandardDefects::TW_HI [static]
 

time walk too big

const DefectPrototype SctData::StandardDefects::TW_LO [static]
 

time walk too small

const DefectPrototype SctData::StandardDefects::UNBONDED [static]
 

Noise <= 750.

const DefectPrototype SctData::StandardDefects::UNDER [static]
 

Occupancy never reaches mas.

const DefectPrototype SctData::StandardDefects::V_NOISY [static]
 

Noise > 1.25* av chip noise.

const DefectPrototype SctData::StandardDefects::VLO_GAIN [static]
 

Gain < 0.3 * chip average.


The documentation for this class was generated from the following files:
Generated on Thu Jul 8 11:42:28 2004 for SCT DAQ/DCS Software - C++ by doxygen 1.3.5