Collaboration diagram for SctData.ModuleDefect:
Other Defects | |
} { | |
ModuleDefect (ModuleDefect prototype, ModuleElement element) | |
Public constructor: Copy the given ModuleDefect and give ModuleElement. | |
boolean | isSevere () |
Return true if this ModuleDefect is severe. | |
ModuleElement | getModuleElement () |
Gets the module element affected by this defect. | |
boolean | isPrototype () |
True if this is a prototype, false if it actually represents a defect. | |
boolean | isUnfittable () |
returns true if defect is serious enough to prevent fitting to this channel. | |
boolean | isUnuseable () |
SCTDAQ definitition of unusable is dead or stuckon. | |
boolean | isDodgy () |
SCTDAQ definitition of `dodgy' is any defect other than dead or stuckon. | |
String | getName () |
Gets the name of this defect. | |
String | getDescription () |
Get a human readable description for this ModuleDefect. | |
double | getParameter () |
Gets a parameter that can be used to determine if something is defective. | |
boolean | isSameTypeAs (ModuleDefect defect) |
Comparison operators. | |
boolean | equals (Object o) |
Returns true if the defect types are the same. | |
String | getClassName () |
void | write (OStream s, ObjectManager o) throws java.io.IOException |
ModuleDefect | read (IStream s, ObjectManager o) throws java.io.IOException |
For I/O use. | |
ModuleDefect | NO_HI = new ModuleDefect(19, true, "NO_HI", "High noise occupancy", 0.0005) |
ModuleDefect | MEAN_ERROR = new ModuleDefect(16, true, "MEAN_ERROR", "Error in the mean", 0) |
high noise occupancy | |
ModuleDefect | SIG_ERROR = new ModuleDefect(17, true, "SIG_ERROR", "Error in the sigma", 0) |
ModuleDefect | STUCK_CELL = new ModuleDefect(21, false, "STUCK_CELL","Stuck cell in the pipeline",0.) |
pipeline | |
ModuleDefect | DEAD_CELL = new ModuleDefect(20, false, "DEAD_CELL","Dead cell in the pipeline",0.) |
pipeline | |
ModuleDefect (int id, boolean severe, String name, String d, double parameter) | |
Private constructor. | |
int | id |
boolean | severe |
String | name |
String | description |
double | parameter |
ModuleElement | element |
Static Public Attributes | |
Fit Defects | |
ModuleDefect | DEAD = new ModuleDefect(1, true, "DEAD", "Dead channel - output always <1%", 0.01) |
Output always v small. | |
ModuleDefect | STUCKON = new ModuleDefect(2, true, "STUCKON", "Dead channel - output always > 98% occupancy", 0.98) |
Output always v high. | |
ModuleDefect | OVER = new ModuleDefect(4, false, "OVER", "Occupancy greater than 100%", 1.) |
Occupancy larger than max. | |
ModuleDefect | UNDER = new ModuleDefect(3, true, "UNDER", "Occupancy never reaches 100%", 1.) |
Occupancy never reaches mas. | |
ModuleDefect | NOINIT = new ModuleDefect(18, true, "NOINIT", "Couldn't initialize fit", 0) |
Couldn't initialize the fit. | |
ModuleDefect | FIT_UNDER = new ModuleDefect(5, true, "FIT_UNDER", "Fitted mean out of bounds low", 0) |
ModuleDefect | FIT_OVER = new ModuleDefect(6, true, "FIT_OVER", "Fitted mean out of bounds high", 0) |
ModuleDefect | SIG_UNDER = new ModuleDefect(7, true, "SIG_UNDER", "Fitted sigma out of bounds low", 0) |
ModuleDefect | SIG_OVER = new ModuleDefect(8, true, "SIG_OVER", "Fitted sigma out of bounds high", 0) |
NPt Gain Defects | |
ModuleDefect | LO_GAIN = new ModuleDefect(9, true, "LO_GAIN", "Gain is less than 0.75*chip average", 0.75) |
Gain < 0.75 * chip average. | |
ModuleDefect | HI_GAIN = new ModuleDefect(10, true, "HI_GAIN", "Gain is higher than 1.25*chip average", 1.25) |
Gain > 1.25 * chip average. | |
ModuleDefect | LO_OFFSET = new ModuleDefect(11, true, "LO_OFFSET", "Offset is less than -100", -100) |
Offset < -100. | |
ModuleDefect | HI_OFFSET = new ModuleDefect(12, true, "HI_OFFSET", "Offset is higher than 12-", 120) |
Offset > 120. | |
ModuleDefect | UNBONDED = new ModuleDefect(13, true, "UNBONDED", "Noise is less than 750", 750) |
Noise <= 750. | |
ModuleDefect | PARTBONDED = new ModuleDefect(14, false, "PARTBONDED", "Noise is less than 1100", 1100) |
Noise <= 1100. | |
ModuleDefect | NOISY = new ModuleDefect(15, true, "NOISY", "Noise is > 1.15*chip average", 1.15) |
Noise > 1.15* av chip noise. | |
Trim Defects | |
} { | |
ModuleDefect | TR_RANGE = new ModuleDefect(22, false, "TR_RANGE","Unusual chip trim step size",0.) |
Unexpected chip trim step size. | |
ModuleDefect | TR_STEP = new ModuleDefect(23, false, "TR_STEP","Channel trim step size different from chip",4.) |
Channel step different from chip. | |
ModuleDefect | TR_OFFSET = new ModuleDefect(24, false, "TR_OFFSET","Channel trim range offset different from chip",4.) |
Channel offset different from chip. | |
ModuleDefect | TR_NOTRIM = new ModuleDefect(25, true, "TR_NOTRIM","Untrimmable channel",0.) |
Untrimmable channel. | |
Static Private Attributes | |
HashMap | defectMap = new HashMap(20) |
A ModuleDefect has a description and can be classified as severe or not severe.
Definition at line 14 of file ModuleDefect.java.
|
Returns true if the defect types are the same. Returns false if either is a prototype.
Definition at line 121 of file ModuleDefect.java. References SctData.ModuleDefect.element, SctData.ModuleElement.equals(), SctData.ModuleDefect.id, and SctData.ModuleDefect.isPrototype(). |
Here is the call graph for this function:
|
True if this is a prototype, false if it actually represents a defect.
Definition at line 73 of file ModuleDefect.java. Referenced by SctData.ModuleDefect.equals(). |
|
Comparison operators. Returns true if the defect types are the same. AND defects refer to the same channels. Definition at line 112 of file ModuleDefect.java. References SctData.ModuleDefect.id. Referenced by SctData.ModuleDefect.isDodgy(), SctData.ModuleDefect.isUnfittable(), and SctData.ModuleDefect.isUnuseable(). |