SctData::TestSummary::FullBypassSummaryWriter Class Reference

Output the result of a FullBypassTest. More...

#include <FullBypassSummaryWriter.h>

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Public Member Functions

virtual void write (const TestResult &t, std::ostream &os) const throw (Sct::IoError, Sct::LogicError)
 override

Static Public Member Functions

static string reason (const short int status)
 Gives a readable meaning to the ChipFBResult status variables.

Static Private Attributes

static bool inMap

Detailed Description

Output the result of a FullBypassTest.

Definition at line 10 of file FullBypassSummaryWriter.h.


Member Function Documentation

string SctData::TestSummary::FullBypassSummaryWriter::reason const short int  status  )  [static]
 

Gives a readable meaning to the ChipFBResult status variables.

Definition at line 36 of file FullBypassSummaryWriter.cpp.

void SctData::TestSummary::FullBypassSummaryWriter::write const TestResult t,
std::ostream &  os
const throw (Sct::IoError, Sct::LogicError) [virtual]
 

override

Implements SctData::TestSummary::SummaryWriter.

Definition at line 9 of file FullBypassSummaryWriter.cpp.

References SctData::FullBypassTestResult::getChipResult(), SctData::FullBypassTestResult::getNConfig(), SctData::TestResult::getNScans(), SctData::TestResult::getTestPointAt(), and Sct::nChipModule.

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The documentation for this class was generated from the following files:
Generated on Mon Feb 6 14:09:10 2006 for SCT DAQ/DCS Software - C++ by  doxygen 1.4.6