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SctData::TestSummary::NPtGainSummaryWriter Class Reference

Output the result of a NPtGainTest (i.e. More...

#include <NPtGainSummaryWriter.h>

Inheritance diagram for SctData::TestSummary::NPtGainSummaryWriter:

Public Member Functions
virtual void	write (const TestResult &t, ostream &os) const throw (Sct::IoError, Sct::LogicError)
	override
Static Private Member Functions
void	outputDefectOnChip (unsigned ichip, const NPtGainTestResult &t, ostream &out) throw ()
	Write out whether there is a defect on a particular chip.
Static Private Attributes
bool	inMap

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Detailed Description

Output the result of a NPtGainTest (i.e.

3-pt gain, and response curve).

Definition at line 12 of file NPtGainSummaryWriter.h.

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Member Function Documentation

void SctData::TestSummary::NPtGainSummaryWriter::outputDefectOnChip (  unsigned    ichip, const NPtGainTestResult &    t, ostream &    out )  throw () [static, private]

Write out whether there is a defect on a particular chip. Parameters: ichip  the chip index 0->11. t  the test result required. out  the output stream. Definition at line 110 of file NPtGainSummaryWriter.cpp.

void SctData::TestSummary::NPtGainSummaryWriter::write (  const TestResult &    t, ostream &    out )  const throw (Sct::IoError, Sct::LogicError) [virtual]

override cout << endl << "Defects: " << endl; const vector< shared_ptr<const ModuleDefect> >& defects = result.getDefects().getAllDefects(); for (unsigned int i=0; i<defects.size(); ++i) { cout << setfill(' ') << setw(20) << defects[i]->getName() << " channel: " << defects[i]->getModuleElement().getFirst() << "# of channels: " << defects[i]->getModuleElement().getNChannels() << "" << defects[i]->getDescription() << endl; } cout << endl; Implements SctData::TestSummary::SummaryWriter. Definition at line 16 of file NPtGainSummaryWriter.cpp. References SctData::ModuleDefectList::defectEncompassingElement(), SctData::NPtGainTestResultData::gain, SctData::NPtGainTestResult::getChannelData(), SctData::NPtGainTestResult::getChipData(), SctData::TestResult::getDefects(), SctData::TestResult::getNScans(), SctData::NPtGainTestResult::getSpecialScanPointValue(), SctData::Stats< T >::mean(), SctData::Stats< T >::modifyAt(), Sct::nChannelChip, Sct::nChipModule, SctData::NPtGainTestResultData::noise, SctData::NPtGainTestResultData::offset, SctData::NPtGainTestResultData::rc, and SctData::Stats< T >::var().

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Field Documentation

bool SctData::TestSummary::NPtGainSummaryWriter::inMap [static, private]

Definition at line 127 of file NPtGainSummaryWriter.cpp.

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The documentation for this class was generated from the following files:

• NPtGainSummaryWriter.h
• NPtGainSummaryWriter.cpp

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