FunctionalOverview

Tests are written up in [Peter's document] and [Alan's IEEE proceedings]

The tests are broken into three categories:

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Those designed to calibrate the back-of-crate (BOC) opto-electronics.

See BocSetupTests

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Those that test & calibrate the digital part of the front-end ASICs

• NMaskTest
• PipelineTest
• FullBypassTest

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Those that test & calibrate the analogue part of the front-end ASICs, typically by using calibration charge injection.

• StrobeDelayTest
• ThreePointGainTest
• TrimRangeTest?
• ResponseCurveTest?
• NoiseOccupancyTest
• DoubleTriggerNoise
• SynchTriggerNoise
• TimeWalkTest?

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To start a test click on the appropriate menu of the SctGui

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Note that the DataDisplayer need not be called from the GUI. Additional/chip/channel-specific information, OccupancyPerEvent and postscript file creation options are obtainable by using the DataDisplayer software directly from the command line.

See Test to find out how a test is prerformed.

See UsefulPrograms for handy stand-alones