Inheritance diagram for DisplayGUI.TestDataInfo:

Public Attributes | |
| double[][] | testDataTolerances | 
| final String[] | chipOptions | 
| final String[] | linkOptions = {"Link 0","Link 1"} | 
| final String[] | dcsOptions = {"Sensor HV(Volts)","Sensor Current(uA)","Hybrid T0(degC)","Hybrid T1(degC)","Chip VCC (Volts)","Chip ICC (mA)","Chip VDD (Volts)","Chip IDD (mA)","TDiff (degC)","Module Power (W)","Chip IPIN"} | 
| final String[] | dcsParams = {"HVchVolt","HVchCurr","MOch_Tm0","MOch_Tm1","LVch_Vcc","LVch_Icc","LVch_Vdd","LVch_Idd","LVchPINI"} | 
| final String[] | configParams = {"Module Group","TX Current","TX Coarse Delay","TX Fine Delay","Mark/Space","RX Threshold","RX Delay"} | 
| final boolean[] | configParams_links = {false,false,false,false,false,true,true} | 
| final String[] | configParamLabels = {"","ST_TX_CURRENT","ST_TX_COARSE","ST_TX_FINE","ST_TX_MARKSPACE","ST_RX_THRESHOLD","ST_RX_DELAY"} | 
| final boolean[] | testIsDefined = {false,false,true,true,true,true,true,true,true,true,false,false,true,true,true,true,true,true,true,true,false} | 
| final boolean[] | testIsSCTDAQ = {true,true,true,true,true,true,true,true,true,true,true,true,false,false,false,false,false,false,false,false,false} | 
Static Public Attributes | |
| static final String[] | testNames | 
| static final String[] | testMenuNames | 
| static final String[] | resultFileKeyNames | 
| static final int | parameterOffset = 4 | 
| static final String[][] | testParameters | 
| static final boolean[][] | doComparisons | 
| static final boolean[][] | isSCTDAQCompatible | 
| static final boolean[][] | canBeZero | 
| static final int | TEST_RESET = 0 | 
| static final int | TEST_REDUNDANCY = 1 | 
| static final int | TEST_FULLBYPASS = 2 | 
| static final int | TEST_PIPELINE = 3 | 
| static final int | TEST_STROBEDELAY = 4 | 
| static final int | TEST_3PTGAIN = 5 | 
| static final int | TEST_TRIM = 6 | 
| static final int | TEST_NPTGAIN = 7 | 
| static final int | TEST_NOISE = 8 | 
| static final int | TEST_TIMEWALK = 9 | 
| static final int | TEST_LONGTERM = 10 | 
| static final int | TEST_IV = 11 | 
| static final int | TEST_NMASK = 12 | 
| static final int | TEST_RXTHRESHOLD = 13 | 
| static final int | TEST_RXTHRESHOLDBASEDONCONFIGREGISTER = 14 | 
| static final int | TEST_RXDELAY = 15 | 
| static final int | TEST_TXCURRENT = 16 | 
| static final int | TEST_DOUBLETRIGGERNOISE = 17 | 
| static final int | TEST_MARKSPACERATIO = 18 | 
| static final int | TEST_CHIPCOUNTER = 19 | 
| static final int | TEST_DEFAULT = 20 | 
Definition at line 6 of file TestDataInfo.java.
      
  | 
  
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 Initial value:  {
                {},
                {},
                {true,true,true,true,true,true,true,true},
                {true,true,true,true,true},
                {true,true,true,true,true},
                {true,true,true,true,true,true,true,true,true,true,true,true,true,true,true,true},
                {true,true,true,true,true,true,true,true,true,true,true,true,true},
                {true,true,true,true,true,true,true,true,true,true,true,true,true,true,true,true},
                {true,true,true,true,true,true,true,true,true,true},
                {true,true,true,true,true,true},
                {},
                {},
                {true,true,true,true},  
                {true, true, true,true,true},
                {true, true, true,true,true,true,true,true},
                {true, true, true,true,true},
                {true, true, true,true,true,true,true,true},
                {true,true,true,true,true,true,true,true},
                {true,true,true,true,true},
                {true,true,true,true},  
                {}
         }
Definition at line 106 of file TestDataInfo.java.  | 
  
      
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 Initial value:  {"Chip Maximum","Chip Minimum","Mean (Link0)","Mean (Link1)","Chip M0","Chip S1","Chip S2","Chip S3","Chip S4","Chip E5","Chip M8",
"Chip S9","Chip S10","Chip S11","Chip S12","Chip E13"}
Definition at line 153 of file TestDataInfo.java.  | 
  
      
  | 
  
| 
 Initial value:  {
                {},
                {},
                {false,false,false,false,true,true,false,false},
                {false,false,false,false,true},
                {false,false,false,false,true},
                {false,false,false,false,false,false,true,false,false,false,false,true,false,false,false,false},
                {false,false,false,false,false,false,true,false,false,false,false,false,false},
                {false,false,false,false,false,false,true,false,false,false,false,true,false,false,false,false},
                {false,false,false,false,false,true,false,true,false,false},
                {false,false,false,false,true,false},
                {},
                {},
                {false,false,false,false},  
                {false,false,false,false,false},
                {false,false,false,false,false,false,false,false},
                {false,false,false,false,false},
                {false,false,false,false,false,false,false},
                {false,false,false,false,false,false,false,false},
                {false,false,false,false,false},
                {false,false,false,false},  
                {}
         }
Definition at line 57 of file TestDataInfo.java.  | 
  
      
  | 
  
| 
 Initial value:  {   
                {},
                {},
                {true,true,true,true,true,true,true,true},
                {true,true,true,true,true},
                {true,true,true,true,true},
                {true,true,true,true,true,true,true,true,true,true,true,true,true,false,false,false},
                {true,true,true,true,true,true,true,true,true,true,true,true,true},
                {true,true,true,true,true,true,true,true,true,true,true,true,true,false,false,false},
                {true,true,true,true,true,true,true,true,false,false},
                {true,true,true,true,true,true},
                {},
                {},
                {false,false,false,false},  
                {false,false,false,false,false},
                {false,false,false,false,false,false,false,false},
                {false,false,false,false,false},
                {false,false,false,false,false,false,false,false},
                {false,false,false,false,false,false,false,false},
                {false,false,false,false,false},
                {false,false,false,false},  
                {}
         }
Definition at line 81 of file TestDataInfo.java.  | 
  
      
  | 
  
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 Initial value:  {"","","FullBypassTest","PipelineTest",
                                               "StrobeDelay","ThreePointGain","Trim","ResponseCurve",
                                               "NO","TimeWalkTest","","DetModIV",
                                               "NMaskTest", "RxThreshold", "RxThresholdBasedOnConfigRegisterTest",
                                               "RxDelay","TxCurrentTest","DoubleTriggerNoise","MarkSpaceRatioTest",
                                               "ChipCounterTest",
                                               "DefaultTest"}
Definition at line 24 of file TestDataInfo.java.  | 
  
      
  | 
  
| 
 Initial value:  {
                {},
                {},
                {0.0,0.0,0.0,0.0,0.1,0.1,1.0,1.0},
                {0.0,0.0,0.0,0.0,1.0},
                {0.0,0.0,0.0,0.0,3.0},
                {0.0,0.0,0.0,0.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,150.0,50.0,1.0,1.0,1.0},
                {0.0,0.0,0.0,0.0,4.0,200.0,1.0,100.0,10.0,100.0,20.0,10.0,1.0},
                {0.0,0.0,0.0,0.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,150.0,50.0,1.0,1.0,1.0},
                {0.0,0.0,0.0,0.0,10.0,5e-5,5e-5,150.0,0.0,0.0},
                {0.0,0.0,0.0,0.0,0.5,0.5},
                {},
                {},
                {0.0, 0.0,0.0,0.0,},
                {0.0, 0.0,0.0, 0.0,3.0},
                {0.0, 0.0,0.0, 0.0,3.0,3.0,3.0,3.0},
                {0.0, 0.0,0.0, 0.0,3.0},
                {0.0, 0.0,0.0, 0.0,3.0,3.0,3.0,3.0},
                {0.0, 0.0,0.0, 0.0,5e-5,5e-5,0.5,1.0},
                {0.0,0.0,0.0,0.0,0.0},
                {0.0, 0.0,0.0,0.0,},
                {}
          }
Definition at line 129 of file TestDataInfo.java.  | 
  
      
  | 
  
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 Initial value:  {"Reset","Redundancy","FullByPass","Pipeline",
                                          "StrobeDelay","3PtGain","Trim","NPtGain",
                                          "Noise","TimeWalk","LongTerm","IVscan",
                                          "NMask","RxThreshold", "RxThresholdFromConfigReg",
                                          "RxDelay", "TxCurrent","DoubleTriggerNoise","MarkSpaceRatio",
                                          "ChipCounter",
                                          "DefaultTest"}
Definition at line 16 of file TestDataInfo.java. Referenced by DisplayGUI.DatabaseLister.initComponents().  | 
  
      
  | 
  
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 Initial value:  {"ResetTest","RedundancyTest","FullBypassTest","PipelineTest",
                                      "StrobeDelayTest","3PtGainTest","TrimRangeTest","NPtGainTest",
                                      "NoiseOccupancyTest","TimeWalkTest","LongTermTest","IVScanTest",
                                      "NMaskTest", "RxThresholdTest", "RxThresholdBasedOnConfigRegisterTest",
                                      "RxDelayTest","TxCurrentTest", "DoubleTriggerNoise","MarkSpaceRatioTest",
                                      "ChipCounterTest",
                                      "DefaultTest"}
Definition at line 8 of file TestDataInfo.java. Referenced by DisplayGUI.DatabaseLister.initComponents(), DisplayGUI.ArchiveQueryBox.initComponents(), DisplayGUI.SCTDBTestDownloader.SCTDBTestDownloader(), and DisplayGUI.TestSelection.TestSelection().  | 
  
      
  | 
  
| 
 Initial value:  {
                {},
                {},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Token","RToken","Token Comment","RToken Comment"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Defective pipelines"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Strobe Delay"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","VT50(mV)","VT50(mV) RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)","ChipSlope Noise","ChipSlope Offset","ChipSlope Gain"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Trim Range","Target","N(untrimmed)","VT50(mV)","VT50(mV) RMS","Offset (mV)","Offset RMS","Step size (mV)","Step Size RMS"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","VT50(mV)","VT50(mV) RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)","ChipSlope Noise","ChipSlope Offset","ChipSlope Gain"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Offset (mV)","Occupancy","RMS Occupancy","Input Noise (enc)","MaxBadness","NoThreshold"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","TimeWalk(ns)","TCal"},
                {},
                {},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions"},  
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Rx Threshold"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Min Rx Threshold","Max Rx Threshold","Best Rx Threshold"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Rx Delay"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Min Tx Current","Max Tx Current","Best Tx Current"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Average Occupancy","Peak Occupancy","Peak Ratio","Peak Bin"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Optimum MS Ratio"},
                {"Result Status","Defect Count","#Bad Chans","DCS Conditions"},  
                {}
         }
Definition at line 34 of file TestDataInfo.java.  | 
  
 1.4.6