Inheritance diagram for DisplayGUI.TestDataInfo:
Public Attributes | |
double[][] | testDataTolerances |
final String[] | chipOptions |
final String[] | linkOptions = {"Link 0","Link 1"} |
final String[] | dcsOptions = {"Sensor HV(Volts)","Sensor Current(uA)","Hybrid T0(degC)","Hybrid T1(degC)","Chip VCC (Volts)","Chip ICC (mA)","Chip VDD (Volts)","Chip IDD (mA)","TDiff (degC)","Module Power (W)","Chip IPIN"} |
final String[] | dcsParams = {"HVchVolt","HVchCurr","MOch_Tm0","MOch_Tm1","LVch_Vcc","LVch_Icc","LVch_Vdd","LVch_Idd","LVchPINI"} |
final String[] | configParams = {"Module Group","TX Current","TX Coarse Delay","TX Fine Delay","Mark/Space","RX Threshold","RX Delay"} |
final boolean[] | configParams_links = {false,false,false,false,false,true,true} |
final String[] | configParamLabels = {"","ST_TX_CURRENT","ST_TX_COARSE","ST_TX_FINE","ST_TX_MARKSPACE","ST_RX_THRESHOLD","ST_RX_DELAY"} |
final boolean[] | testIsDefined = {false,false,true,true,true,true,true,true,true,true,false,false,true,true,true,true,true,true,true,true,false} |
final boolean[] | testIsSCTDAQ = {true,true,true,true,true,true,true,true,true,true,true,true,false,false,false,false,false,false,false,false,false} |
Static Public Attributes | |
static final String[] | testNames |
static final String[] | testMenuNames |
static final String[] | resultFileKeyNames |
static final int | parameterOffset = 4 |
static final String[][] | testParameters |
static final boolean[][] | doComparisons |
static final boolean[][] | isSCTDAQCompatible |
static final boolean[][] | canBeZero |
static final int | TEST_RESET = 0 |
static final int | TEST_REDUNDANCY = 1 |
static final int | TEST_FULLBYPASS = 2 |
static final int | TEST_PIPELINE = 3 |
static final int | TEST_STROBEDELAY = 4 |
static final int | TEST_3PTGAIN = 5 |
static final int | TEST_TRIM = 6 |
static final int | TEST_NPTGAIN = 7 |
static final int | TEST_NOISE = 8 |
static final int | TEST_TIMEWALK = 9 |
static final int | TEST_LONGTERM = 10 |
static final int | TEST_IV = 11 |
static final int | TEST_NMASK = 12 |
static final int | TEST_RXTHRESHOLD = 13 |
static final int | TEST_RXTHRESHOLDBASEDONCONFIGREGISTER = 14 |
static final int | TEST_RXDELAY = 15 |
static final int | TEST_TXCURRENT = 16 |
static final int | TEST_DOUBLETRIGGERNOISE = 17 |
static final int | TEST_MARKSPACERATIO = 18 |
static final int | TEST_CHIPCOUNTER = 19 |
static final int | TEST_DEFAULT = 20 |
Definition at line 6 of file TestDataInfo.java.
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Initial value: { {}, {}, {true,true,true,true,true,true,true,true}, {true,true,true,true,true}, {true,true,true,true,true}, {true,true,true,true,true,true,true,true,true,true,true,true,true,true,true,true}, {true,true,true,true,true,true,true,true,true,true,true,true,true}, {true,true,true,true,true,true,true,true,true,true,true,true,true,true,true,true}, {true,true,true,true,true,true,true,true,true,true}, {true,true,true,true,true,true}, {}, {}, {true,true,true,true}, {true, true, true,true,true}, {true, true, true,true,true,true,true,true}, {true, true, true,true,true}, {true, true, true,true,true,true,true,true}, {true,true,true,true,true,true,true,true}, {true,true,true,true,true}, {true,true,true,true}, {} } Definition at line 106 of file TestDataInfo.java. |
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Initial value: {"Chip Maximum","Chip Minimum","Mean (Link0)","Mean (Link1)","Chip M0","Chip S1","Chip S2","Chip S3","Chip S4","Chip E5","Chip M8", "Chip S9","Chip S10","Chip S11","Chip S12","Chip E13"} Definition at line 153 of file TestDataInfo.java. |
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Initial value: { {}, {}, {false,false,false,false,true,true,false,false}, {false,false,false,false,true}, {false,false,false,false,true}, {false,false,false,false,false,false,true,false,false,false,false,true,false,false,false,false}, {false,false,false,false,false,false,true,false,false,false,false,false,false}, {false,false,false,false,false,false,true,false,false,false,false,true,false,false,false,false}, {false,false,false,false,false,true,false,true,false,false}, {false,false,false,false,true,false}, {}, {}, {false,false,false,false}, {false,false,false,false,false}, {false,false,false,false,false,false,false,false}, {false,false,false,false,false}, {false,false,false,false,false,false,false}, {false,false,false,false,false,false,false,false}, {false,false,false,false,false}, {false,false,false,false}, {} } Definition at line 57 of file TestDataInfo.java. |
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Initial value: { {}, {}, {true,true,true,true,true,true,true,true}, {true,true,true,true,true}, {true,true,true,true,true}, {true,true,true,true,true,true,true,true,true,true,true,true,true,false,false,false}, {true,true,true,true,true,true,true,true,true,true,true,true,true}, {true,true,true,true,true,true,true,true,true,true,true,true,true,false,false,false}, {true,true,true,true,true,true,true,true,false,false}, {true,true,true,true,true,true}, {}, {}, {false,false,false,false}, {false,false,false,false,false}, {false,false,false,false,false,false,false,false}, {false,false,false,false,false}, {false,false,false,false,false,false,false,false}, {false,false,false,false,false,false,false,false}, {false,false,false,false,false}, {false,false,false,false}, {} } Definition at line 81 of file TestDataInfo.java. |
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Initial value: {"","","FullBypassTest","PipelineTest", "StrobeDelay","ThreePointGain","Trim","ResponseCurve", "NO","TimeWalkTest","","DetModIV", "NMaskTest", "RxThreshold", "RxThresholdBasedOnConfigRegisterTest", "RxDelay","TxCurrentTest","DoubleTriggerNoise","MarkSpaceRatioTest", "ChipCounterTest", "DefaultTest"} Definition at line 24 of file TestDataInfo.java. |
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Initial value: { {}, {}, {0.0,0.0,0.0,0.0,0.1,0.1,1.0,1.0}, {0.0,0.0,0.0,0.0,1.0}, {0.0,0.0,0.0,0.0,3.0}, {0.0,0.0,0.0,0.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,150.0,50.0,1.0,1.0,1.0}, {0.0,0.0,0.0,0.0,4.0,200.0,1.0,100.0,10.0,100.0,20.0,10.0,1.0}, {0.0,0.0,0.0,0.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,150.0,50.0,1.0,1.0,1.0}, {0.0,0.0,0.0,0.0,10.0,5e-5,5e-5,150.0,0.0,0.0}, {0.0,0.0,0.0,0.0,0.5,0.5}, {}, {}, {0.0, 0.0,0.0,0.0,}, {0.0, 0.0,0.0, 0.0,3.0}, {0.0, 0.0,0.0, 0.0,3.0,3.0,3.0,3.0}, {0.0, 0.0,0.0, 0.0,3.0}, {0.0, 0.0,0.0, 0.0,3.0,3.0,3.0,3.0}, {0.0, 0.0,0.0, 0.0,5e-5,5e-5,0.5,1.0}, {0.0,0.0,0.0,0.0,0.0}, {0.0, 0.0,0.0,0.0,}, {} } Definition at line 129 of file TestDataInfo.java. |
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Initial value: {"Reset","Redundancy","FullByPass","Pipeline", "StrobeDelay","3PtGain","Trim","NPtGain", "Noise","TimeWalk","LongTerm","IVscan", "NMask","RxThreshold", "RxThresholdFromConfigReg", "RxDelay", "TxCurrent","DoubleTriggerNoise","MarkSpaceRatio", "ChipCounter", "DefaultTest"} Definition at line 16 of file TestDataInfo.java. Referenced by DisplayGUI.DatabaseLister.initComponents(). |
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Initial value: {"ResetTest","RedundancyTest","FullBypassTest","PipelineTest", "StrobeDelayTest","3PtGainTest","TrimRangeTest","NPtGainTest", "NoiseOccupancyTest","TimeWalkTest","LongTermTest","IVScanTest", "NMaskTest", "RxThresholdTest", "RxThresholdBasedOnConfigRegisterTest", "RxDelayTest","TxCurrentTest", "DoubleTriggerNoise","MarkSpaceRatioTest", "ChipCounterTest", "DefaultTest"} Definition at line 8 of file TestDataInfo.java. Referenced by DisplayGUI.DatabaseLister.initComponents(), DisplayGUI.ArchiveQueryBox.initComponents(), DisplayGUI.SCTDBTestDownloader.SCTDBTestDownloader(), and DisplayGUI.TestSelection.TestSelection(). |
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Initial value: { {}, {}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Token","RToken","Token Comment","RToken Comment"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Defective pipelines"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Strobe Delay"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","VT50(mV)","VT50(mV) RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)","ChipSlope Noise","ChipSlope Offset","ChipSlope Gain"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Trim Range","Target","N(untrimmed)","VT50(mV)","VT50(mV) RMS","Offset (mV)","Offset RMS","Step size (mV)","Step Size RMS"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","VT50(mV)","VT50(mV) RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)","ChipSlope Noise","ChipSlope Offset","ChipSlope Gain"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Offset (mV)","Occupancy","RMS Occupancy","Input Noise (enc)","MaxBadness","NoThreshold"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","TimeWalk(ns)","TCal"}, {}, {}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Rx Threshold"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Min Rx Threshold","Max Rx Threshold","Best Rx Threshold"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Rx Delay"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Min Tx Current","Max Tx Current","Best Tx Current"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Average Occupancy","Peak Occupancy","Peak Ratio","Peak Bin"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions","Optimum MS Ratio"}, {"Result Status","Defect Count","#Bad Chans","DCS Conditions"}, {} } Definition at line 34 of file TestDataInfo.java. |