Inheritance diagram for DisplayGUI.TestDataInfo:

Public Attributes | |
| double[][] | testDataTolerances |
| final String[] | chipOptions |
| final String[] | linkOptions = {"Link 0","Link 1"} |
| final String[] | dcsOptions = {"Sensor HV(Volts)","Sensor Current(uA)","Hybrid T0(degC)","Hybrid T1(degC)","Chip VCC (Volts)","Chip ICC (mA)","Chip VDD (Volts)","Chip IDD (mA)","TDiff (degC)","Module Power (W)","Chip IPIN"} |
| final String[] | dcsParams = {"HVchVolt","HVchCurr","MOch_Tm0","MOch_Tm1","LVch_Vcc","LVch_Icc","LVch_Vdd","LVch_Idd","LVchPINI"} |
| final String[] | configParams = {"Module Group","TX Current","TX Coarse Delay","TX Fine Delay","Mark/Space","RX Threshold","RX Delay"} |
| final boolean[] | configParams_links = {false,false,false,false,false,true,true} |
| final String[] | configParamLabels = {"","ST_TX_CURRENT","ST_TX_COARSE","ST_TX_FINE","ST_TX_MARKSPACE","ST_RX_THRESHOLD","ST_RX_DELAY"} |
| final boolean[] | testIsDefined = {false,false,true,true,true,true,true,true,true,true,false,false,true,true,true,true,true,true,true,true,false} |
| final boolean[] | testIsSCTDAQ = {true,true,true,true,true,true,true,true,true,true,true,true,false,false,false,false,false,false,false,false,false} |
Static Public Attributes | |
| static final String[] | testNames |
| static final String[] | testMenuNames |
| static final String[] | resultFileKeyNames |
| static final int | parameterOffset = 4 |
| static final String[][] | testParameters |
| static final boolean[][] | doComparisons |
| static final boolean[][] | isSCTDAQCompatible |
| static final boolean[][] | canBeZero |
| static final int | TEST_RESET = 0 |
| static final int | TEST_REDUNDANCY = 1 |
| static final int | TEST_FULLBYPASS = 2 |
| static final int | TEST_PIPELINE = 3 |
| static final int | TEST_STROBEDELAY = 4 |
| static final int | TEST_3PTGAIN = 5 |
| static final int | TEST_TRIM = 6 |
| static final int | TEST_NPTGAIN = 7 |
| static final int | TEST_NOISE = 8 |
| static final int | TEST_TIMEWALK = 9 |
| static final int | TEST_LONGTERM = 10 |
| static final int | TEST_IV = 11 |
| static final int | TEST_NMASK = 12 |
| static final int | TEST_RXTHRESHOLD = 13 |
| static final int | TEST_RXTHRESHOLDBASEDONCONFIGREGISTER = 14 |
| static final int | TEST_RXDELAY = 15 |
| static final int | TEST_TXCURRENT = 16 |
| static final int | TEST_DOUBLETRIGGERNOISE = 17 |
| static final int | TEST_MARKSPACERATIO = 18 |
| static final int | TEST_CHIPCOUNTER = 19 |
| static final int | TEST_DEFAULT = 20 |
Definition at line 6 of file TestDataInfo.java.
|
|
Initial value: {
{},
{},
{true,true,true,true,true,true,true,true},
{true,true,true,true,true},
{true,true,true,true,true},
{true,true,true,true,true,true,true,true,true,true,true,true,true,true,true,true},
{true,true,true,true,true,true,true,true,true,true,true,true,true},
{true,true,true,true,true,true,true,true,true,true,true,true,true,true,true,true},
{true,true,true,true,true,true,true,true,true,true},
{true,true,true,true,true,true},
{},
{},
{true,true,true,true},
{true, true, true,true,true},
{true, true, true,true,true,true,true,true},
{true, true, true,true,true},
{true, true, true,true,true,true,true,true},
{true,true,true,true,true,true,true,true},
{true,true,true,true,true},
{true,true,true,true},
{}
}
Definition at line 106 of file TestDataInfo.java. |
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|
Initial value: {"Chip Maximum","Chip Minimum","Mean (Link0)","Mean (Link1)","Chip M0","Chip S1","Chip S2","Chip S3","Chip S4","Chip E5","Chip M8",
"Chip S9","Chip S10","Chip S11","Chip S12","Chip E13"}
Definition at line 153 of file TestDataInfo.java. |
|
|
Initial value: {
{},
{},
{false,false,false,false,true,true,false,false},
{false,false,false,false,true},
{false,false,false,false,true},
{false,false,false,false,false,false,true,false,false,false,false,true,false,false,false,false},
{false,false,false,false,false,false,true,false,false,false,false,false,false},
{false,false,false,false,false,false,true,false,false,false,false,true,false,false,false,false},
{false,false,false,false,false,true,false,true,false,false},
{false,false,false,false,true,false},
{},
{},
{false,false,false,false},
{false,false,false,false,false},
{false,false,false,false,false,false,false,false},
{false,false,false,false,false},
{false,false,false,false,false,false,false},
{false,false,false,false,false,false,false,false},
{false,false,false,false,false},
{false,false,false,false},
{}
}
Definition at line 57 of file TestDataInfo.java. |
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|
Initial value: {
{},
{},
{true,true,true,true,true,true,true,true},
{true,true,true,true,true},
{true,true,true,true,true},
{true,true,true,true,true,true,true,true,true,true,true,true,true,false,false,false},
{true,true,true,true,true,true,true,true,true,true,true,true,true},
{true,true,true,true,true,true,true,true,true,true,true,true,true,false,false,false},
{true,true,true,true,true,true,true,true,false,false},
{true,true,true,true,true,true},
{},
{},
{false,false,false,false},
{false,false,false,false,false},
{false,false,false,false,false,false,false,false},
{false,false,false,false,false},
{false,false,false,false,false,false,false,false},
{false,false,false,false,false,false,false,false},
{false,false,false,false,false},
{false,false,false,false},
{}
}
Definition at line 81 of file TestDataInfo.java. |
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|
Initial value: {"","","FullBypassTest","PipelineTest",
"StrobeDelay","ThreePointGain","Trim","ResponseCurve",
"NO","TimeWalkTest","","DetModIV",
"NMaskTest", "RxThreshold", "RxThresholdBasedOnConfigRegisterTest",
"RxDelay","TxCurrentTest","DoubleTriggerNoise","MarkSpaceRatioTest",
"ChipCounterTest",
"DefaultTest"}
Definition at line 24 of file TestDataInfo.java. |
|
|
Initial value: {
{},
{},
{0.0,0.0,0.0,0.0,0.1,0.1,1.0,1.0},
{0.0,0.0,0.0,0.0,1.0},
{0.0,0.0,0.0,0.0,3.0},
{0.0,0.0,0.0,0.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,150.0,50.0,1.0,1.0,1.0},
{0.0,0.0,0.0,0.0,4.0,200.0,1.0,100.0,10.0,100.0,20.0,10.0,1.0},
{0.0,0.0,0.0,0.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,150.0,50.0,1.0,1.0,1.0},
{0.0,0.0,0.0,0.0,10.0,5e-5,5e-5,150.0,0.0,0.0},
{0.0,0.0,0.0,0.0,0.5,0.5},
{},
{},
{0.0, 0.0,0.0,0.0,},
{0.0, 0.0,0.0, 0.0,3.0},
{0.0, 0.0,0.0, 0.0,3.0,3.0,3.0,3.0},
{0.0, 0.0,0.0, 0.0,3.0},
{0.0, 0.0,0.0, 0.0,3.0,3.0,3.0,3.0},
{0.0, 0.0,0.0, 0.0,5e-5,5e-5,0.5,1.0},
{0.0,0.0,0.0,0.0,0.0},
{0.0, 0.0,0.0,0.0,},
{}
}
Definition at line 129 of file TestDataInfo.java. |
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|
Initial value: {"Reset","Redundancy","FullByPass","Pipeline",
"StrobeDelay","3PtGain","Trim","NPtGain",
"Noise","TimeWalk","LongTerm","IVscan",
"NMask","RxThreshold", "RxThresholdFromConfigReg",
"RxDelay", "TxCurrent","DoubleTriggerNoise","MarkSpaceRatio",
"ChipCounter",
"DefaultTest"}
Definition at line 16 of file TestDataInfo.java. Referenced by DisplayGUI.DatabaseLister.initComponents(). |
|
|
Initial value: {"ResetTest","RedundancyTest","FullBypassTest","PipelineTest",
"StrobeDelayTest","3PtGainTest","TrimRangeTest","NPtGainTest",
"NoiseOccupancyTest","TimeWalkTest","LongTermTest","IVScanTest",
"NMaskTest", "RxThresholdTest", "RxThresholdBasedOnConfigRegisterTest",
"RxDelayTest","TxCurrentTest", "DoubleTriggerNoise","MarkSpaceRatioTest",
"ChipCounterTest",
"DefaultTest"}
Definition at line 8 of file TestDataInfo.java. Referenced by DisplayGUI.DatabaseLister.initComponents(), DisplayGUI.ArchiveQueryBox.initComponents(), DisplayGUI.SCTDBTestDownloader.SCTDBTestDownloader(), and DisplayGUI.TestSelection.TestSelection(). |
|
|
Initial value: {
{},
{},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Token","RToken","Token Comment","RToken Comment"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Defective pipelines"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Strobe Delay"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","VT50(mV)","VT50(mV) RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)","ChipSlope Noise","ChipSlope Offset","ChipSlope Gain"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Trim Range","Target","N(untrimmed)","VT50(mV)","VT50(mV) RMS","Offset (mV)","Offset RMS","Step size (mV)","Step Size RMS"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","VT50(mV)","VT50(mV) RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)","ChipSlope Noise","ChipSlope Offset","ChipSlope Gain"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Offset (mV)","Occupancy","RMS Occupancy","Input Noise (enc)","MaxBadness","NoThreshold"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","TimeWalk(ns)","TCal"},
{},
{},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Rx Threshold"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Min Rx Threshold","Max Rx Threshold","Best Rx Threshold"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Rx Delay"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Min Tx Current","Max Tx Current","Best Tx Current"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Average Occupancy","Peak Occupancy","Peak Ratio","Peak Bin"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions","Optimum MS Ratio"},
{"Result Status","Defect Count","#Bad Chans","DCS Conditions"},
{}
}
Definition at line 34 of file TestDataInfo.java. |
1.4.6