SctData::TestSummary::NoiseOccupancySummaryWriter Class Reference

Output the result of a NoiseOccupancyTest. More...

#include <NoiseOccupancySummaryWriter.h>

Inheritance diagram for SctData::TestSummary::NoiseOccupancySummaryWriter:

[legend]Collaboration diagram for SctData::TestSummary::NoiseOccupancySummaryWriter:

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Public Member Functions
virtual void	write (const TestResult &t, ostream &os) const throw (Sct::IoError, Sct::LogicError)
	override
Static Private Attributes
static bool	inMap

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Detailed Description

Output the result of a NoiseOccupancyTest.

Just 12 integers + defects.

Definition at line 13 of file NoiseOccupancySummaryWriter.h.

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Member Function Documentation

void SctData::TestSummary::NoiseOccupancySummaryWriter::write (  const TestResult &  t, ostream &  os )  const throw (Sct::IoError, Sct::LogicError) [virtual]

override Definition at line 14 of file NoiseOccupancySummaryWriter.cpp. References SctData::NoiseOccupancyTestResult::getChipResult(), Sct::nChipModule, and SctData::ChipNOResult::offset. Here is the call graph for this function:

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The documentation for this class was generated from the following files:

• NoiseOccupancySummaryWriter.h
• NoiseOccupancySummaryWriter.cpp

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