SctData::TestSummary::NPtGainSummaryWriter Class Reference

Output the result of a NPtGainTest (i.e. More...

#include <NPtGainSummaryWriter.h>

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Public Member Functions

virtual void write (const TestResult &t, ostream &os) const throw (Sct::IoError, Sct::LogicError)
 override

Static Private Member Functions

static void outputDefectOnChip (unsigned ichip, const NPtGainTestResult &t, ostream &out) throw ()
 Write out whether there is a defect on a particular chip.

Static Private Attributes

static bool inMap

Detailed Description

Output the result of a NPtGainTest (i.e.

3-pt gain, and response curve).

Definition at line 13 of file NPtGainSummaryWriter.h.


Member Function Documentation

void SctData::TestSummary::NPtGainSummaryWriter::outputDefectOnChip unsigned  ichip,
const NPtGainTestResult t,
ostream &  out
throw () [static, private]
 

Write out whether there is a defect on a particular chip.

Parameters:
ichip the chip index 0->11.
t the test result required.
out the output stream.

Definition at line 112 of file NPtGainSummaryWriter.cpp.

void SctData::TestSummary::NPtGainSummaryWriter::write const TestResult t,
ostream &  os
const throw (Sct::IoError, Sct::LogicError) [virtual]
 

override

Definition at line 15 of file NPtGainSummaryWriter.cpp.

References SctData::TestResult::getNScans().

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The documentation for this class was generated from the following files:
Generated on Mon Feb 6 14:09:13 2006 for SCT DAQ/DCS Software - C++ by  doxygen 1.4.6