SctData::StandardDefects Class Reference

This is a holder class for all the DefectPrototype objects that are used. More...

#include <StandardDefects.h>

Collaboration diagram for SctData::StandardDefects:

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Static Public Attributes
static const DefectPrototype	DEAD
	Output always v small.
static const DefectPrototype	STUCKON
	Output always v high.
static const DefectPrototype	OVER
	Occupancy larger than max.
static const DefectPrototype	UNDER
	Occupancy never reaches mas.
static const DefectPrototype	NOINIT
	Couldn't initialize the fit.
static const DefectPrototype	BADFIT
	The fit was not good for some reason - parameter is a chi2 cut.
static const DefectPrototype	SD_LO
	Low edge is not between 0 and 35.
static const DefectPrototype	SD_HI
	Low edge is above 63.
static const DefectPrototype	VLO_GAIN
	Gain < 0.3 * chip average.
static const DefectPrototype	LO_GAIN
	Gain < 0.75 * chip average.
static const DefectPrototype	HI_GAIN
	Gain > 1.25 * chip average.
static const DefectPrototype	LO_OFFSET
	Offset < -100.
static const DefectPrototype	HI_OFFSET
	Offset > 120.
static const DefectPrototype	UNBONDED
	Noise <= 750.
static const DefectPrototype	PARTBONDED
	Noise <= 1100.
static const DefectPrototype	NOISY
	Noise > 1.15* av chip noise.
static const DefectPrototype	V_NOISY
	Noise > 1.25* av chip noise.
static const DefectPrototype	NOISE_SLOPE
	Gain < 0.3 * chip average.
static const DefectPrototype	OFFSET_SLOPE
	Slope in noise across module.
static const DefectPrototype	GAIN_SLOPE
	Slope in offset across module.
static const DefectPrototype	TR_RANGE
	Slope in gain across module Unexpected chip trim step size.
static const DefectPrototype	TR_STEP
	Channel step different from chip.
static const DefectPrototype	TR_OFFSET
	Channel offset different from chip.
static const DefectPrototype	TR_NOTRIM
	Untrimmable channel.
static const DefectPrototype	NO_HI
static const DefectPrototype	MEAN_ERROR
	high noise occupancy
static const DefectPrototype	SIG_ERROR
static const DefectPrototype	STUCK_CELL
	pipeline
static const DefectPrototype	DEAD_CELL
	pipeline
static const DefectPrototype	TOKEN
	full bypass token
static const DefectPrototype	RTOKEN
	full bypass token
static const DefectPrototype	TW_HI
	time walk too big
static const DefectPrototype	TW_LO
	time walk too small
static const DefectPrototype	BAD_OPE
	bad occupancy per event variance
static const DefectPrototype	DOUBTR_HI
	high double trigger noise occupancy
static const DefectPrototype	L1_COUNTER
	Level1 trigger counter defect.
static const DefectPrototype	BC_COUNTER
	Bunch crossing counter defect.

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Detailed Description

This is a holder class for all the DefectPrototype objects that are used.

Author:

Matthew Palmer

Definition at line 13 of file StandardDefects.h.

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Field Documentation

const DefectPrototype SctData::StandardDefects::BAD_OPE [static]

bad occupancy per event variance Definition at line 57 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::BADFIT [static]

The fit was not good for some reason - parameter is a chi2 cut. Definition at line 21 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::BC_COUNTER [static]

Bunch crossing counter defect. Definition at line 61 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::DEAD [static]

Output always v small. Definition at line 16 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::DEAD_CELL [static]

pipeline Definition at line 52 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::DOUBTR_HI [static]

high double trigger noise occupancy Definition at line 58 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::GAIN_SLOPE [static]

Slope in offset across module. Definition at line 39 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::HI_GAIN [static]

Gain > 1.25 * chip average. Definition at line 30 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::HI_OFFSET [static]

Offset > 120. Definition at line 32 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::L1_COUNTER [static]

Level1 trigger counter defect. Definition at line 60 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::LO_GAIN [static]

Gain < 0.75 * chip average. Definition at line 29 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::LO_OFFSET [static]

Offset < -100. Definition at line 31 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::MEAN_ERROR [static]

high noise occupancy Definition at line 49 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::NOINIT [static]

Couldn't initialize the fit. Definition at line 20 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::NOISE_SLOPE [static]

Gain < 0.3 * chip average. Definition at line 37 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::NOISY [static]

Noise > 1.15* av chip noise. Definition at line 35 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::OFFSET_SLOPE [static]

Slope in noise across module. Definition at line 38 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::OVER [static]

Occupancy larger than max. Definition at line 18 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::PARTBONDED [static]

Noise <= 1100. Definition at line 34 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::RTOKEN [static]

full bypass token Definition at line 54 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::SD_HI [static]

Low edge is above 63. Definition at line 25 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::SD_LO [static]

Low edge is not between 0 and 35. Definition at line 24 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::STUCK_CELL [static]

pipeline Definition at line 51 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::STUCKON [static]

Output always v high. Definition at line 17 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TOKEN [static]

full bypass token Definition at line 53 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TR_NOTRIM [static]

Untrimmable channel. Definition at line 45 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TR_OFFSET [static]

Channel offset different from chip. Definition at line 44 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TR_RANGE [static]

Slope in gain across module Unexpected chip trim step size. Definition at line 42 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TR_STEP [static]

Channel step different from chip. Definition at line 43 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TW_HI [static]

time walk too big Definition at line 55 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::TW_LO [static]

time walk too small Definition at line 56 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::UNBONDED [static]

Noise <= 750. Definition at line 33 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::UNDER [static]

Occupancy never reaches mas. Definition at line 19 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::V_NOISY [static]

Noise > 1.25* av chip noise. Definition at line 36 of file StandardDefects.h.

const DefectPrototype SctData::StandardDefects::VLO_GAIN [static]

Gain < 0.3 * chip average. Definition at line 28 of file StandardDefects.h.

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The documentation for this class was generated from the following files:

• StandardDefects.h
• StandardDefects.cpp

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