SctAnalysis::OpeTool Class Reference

Analysis of OccupancyPerEvent data. More...

#include <OpeTool.h>

Public Member Functions
	OpeTool ()
	~OpeTool ()
boost::shared_ptr< SctData::OpeResult >	OpeTool::analyzeModule (const SctData::RawScanResult &raw)
	For each threshold value for each chip, the analysis evaluates the mean and the variance of the distribution.
double	OpeTool::findChi2Binomial (const TH1 &data)
double	OpeTool::fractionVariance (const TH1 &data)

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Detailed Description

Analysis of OccupancyPerEvent data.

For now, it only accepts the Raw data from NoiseOccupancy but this could be extended in the near future.

Definition at line 10 of file OpeTool.h.

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Member Function Documentation

boost::shared_ptr<SctData::OpeResult> SctAnalysis::OpeTool::OpeTool::analyzeModule (  const SctData::RawScanResult &  raw  )

For each threshold value for each chip, the analysis evaluates the mean and the variance of the distribution. Using propreties of the Binomial distribution, a variance is calculated from the mean. Badness is defined as the ratio of the evaluated variance to the calculated variance. Badness bigger then 2 should be flagged as bad.

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The documentation for this class was generated from the following files:

• OpeTool.h
• OpeTool.cpp

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