NPt Gain Defects | |
ModuleDefect (ModuleDefect prototype, ModuleElement element) | |
Public constructor: Copy the given ModuleDefect and give ModuleElement. | |
boolean | isSevere () |
Return true if this ModuleDefect is severe. | |
ModuleElement | getModuleElement () |
Gets the module element affected by this defect. | |
boolean | isPrototype () |
True if this is a prototype, false if it actually represents a defect. | |
boolean | isUnfittable () |
returns true if defect is serious enough to prevent fitting to this channel. | |
boolean | isUnuseable () |
SCTDAQ definitition of unusable is dead or stuckon. | |
boolean | isDodgy () |
SCTDAQ definitition of `dodgy' is any defect other than dead or stuckon. | |
String | getName () |
Gets the name of this defect. | |
String | getDescription () |
Get a human readable description for this ModuleDefect. | |
double | getParameter () |
Gets a parameter that can be used to determine if something is defective. | |
boolean | isSameTypeAs (ModuleDefect defect) |
Comparison operators. | |
boolean | equals (Object o) |
Returns true if the defect types are the same. | |
String | getClassName () |
void | write (OStream s, ObjectManager o) throws java.io.IOException |
ModuleDefect | read (IStream s, ObjectManager o) throws java.io.IOException |
For I/O use. | |
ModuleDefect | LO_GAIN = new ModuleDefect(9, true, "LO_GAIN", "Gain is less than 0.75*chip average", 0.75) |
Gain < 0.75 * chip average. | |
ModuleDefect | HI_GAIN = new ModuleDefect(10, true, "HI_GAIN", "Gain is higher than 1.25*chip average", 1.25) |
Gain > 1.25 * chip average. | |
ModuleDefect | LO_OFFSET = new ModuleDefect(11, true, "LO_OFFSET", "Offset is less than -100", -100) |
Offset < -100. | |
ModuleDefect | HI_OFFSET = new ModuleDefect(12, true, "HI_OFFSET", "Offset is higher than 12-", 120) |
Offset > 120. | |
ModuleDefect | UNBONDED = new ModuleDefect(13, true, "UNBONDED", "Noise is less than 750", 750) |
Noise <= 750. | |
ModuleDefect | PARTBONDED = new ModuleDefect(14, false, "PARTBONDED", "Noise is less than 1100", 1100) |
Noise <= 1100. | |
ModuleDefect | NOISY = new ModuleDefect(15, true, "NOISY", "Noise is > 1.15*chip average", 1.15) |
Noise > 1.15* av chip noise } { Trim Defects. | |
ModuleDefect | TR_RANGE = new ModuleDefect(22, false, "TR_RANGE","Unusual chip trim step size",0.) |
Unexpected chip trim step size. | |
ModuleDefect | TR_STEP = new ModuleDefect(23, false, "TR_STEP","Channel trim step size different from chip",4.) |
Channel step different from chip. | |
ModuleDefect | TR_OFFSET = new ModuleDefect(24, false, "TR_OFFSET","Channel trim range offset different from chip",4.) |
Channel offset different from chip. | |
ModuleDefect | TR_NOTRIM = new ModuleDefect(25, true, "TR_NOTRIM","Untrimmable channel",0.) |
Untrimmable channel } { Other Defects. | |
ModuleDefect | NO_HI = new ModuleDefect(19, true, "NO_HI", "High noise occupancy", 0.0005) |
ModuleDefect | MEAN_ERROR = new ModuleDefect(16, true, "MEAN_ERROR", "Error in the mean", 0) |
high noise occupancy | |
ModuleDefect | SIG_ERROR = new ModuleDefect(17, true, "SIG_ERROR", "Error in the sigma", 0) |
ModuleDefect | STUCK_CELL = new ModuleDefect(21, false, "STUCK_CELL","Stuck cell in the pipeline",0.) |
pipeline | |
ModuleDefect | DEAD_CELL = new ModuleDefect(20, false, "DEAD_CELL","Dead cell in the pipeline",0.) |
pipeline | |
Static Public Attributes | |
Fit Defects | |
ModuleDefect | DEAD = new ModuleDefect(1, true, "DEAD", "Dead channel - output always <1%", 0.01) |
Output always v small. | |
ModuleDefect | STUCKON = new ModuleDefect(2, true, "STUCKON", "Dead channel - output always > 98% occupancy", 0.98) |
Output always v high. | |
ModuleDefect | OVER = new ModuleDefect(4, false, "OVER", "Occupancy greater than 100%", 1.) |
Occupancy larger than max. | |
ModuleDefect | UNDER = new ModuleDefect(3, true, "UNDER", "Occupancy never reaches 100%", 1.) |
Occupancy never reaches mas. | |
ModuleDefect | NOINIT = new ModuleDefect(18, true, "NOINIT", "Couldn't initialize fit", 0) |
Couldn't initialize the fit. | |
ModuleDefect | FIT_UNDER = new ModuleDefect(5, true, "FIT_UNDER", "Fitted mean out of bounds low", 0) |
ModuleDefect | FIT_OVER = new ModuleDefect(6, true, "FIT_OVER", "Fitted mean out of bounds high", 0) |
ModuleDefect | SIG_UNDER = new ModuleDefect(7, true, "SIG_UNDER", "Fitted sigma out of bounds low", 0) |
ModuleDefect | SIG_OVER = new ModuleDefect(8, true, "SIG_OVER", "Fitted sigma out of bounds high", 0) |
A ModuleDefect has a description and can be classified as severe or not severe.
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Returns true if the defect types are the same. Returns false if either is a prototype.
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True if this is a prototype, false if it actually represents a defect.
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Comparison operators. Returns true if the defect types are the same. AND defects refer to the same channels. |