TestsForBarrelSix

Barrel 6 Routine Assembly Tests

General - 16 bit histograms would speed up r/o time for most of these. (Exceptions: NoiseOccupancyTest and DoubleTriggerNoise test, best done with higher statistics.)

Select 0

• RX threshold Scan
  • 10 -> 250, step 10
• NMask
  • 32 ->128, step 32 - (in cvs untested - Alan)
• StrobeDelayTest
  • unchanged
• ThreePointGainTest
  • including slope analysis, otherwise unchanged
• NoiseOccupancyTest
  • including OPE analysis, otherwise unchanged
  • what about doing this with synch triggers? Alan
• DoubleTriggerNoise
  • hunt for light leaks
  • minimum number of bins, range tbc
  • can we calculate baseline from NO test?

Select 1

not routinely

• need at least one threshold scan to look for slope variations
  • Alan reminds himself that this is a slope across chips
  • Alan asks himself if the NPtGain? analysis will fall over with a single point?! - probably will unless modified.
• suggest 2fC threshold scan, same conditions as 3PG
• need to change select using DDC - but already works
• would be most efficient if redundant mappings can be selected online, otherwise must set up and run StrobeDelayTest first. (????)
  • Alan dosent understand :(

Alan notes that some charactersitics, such as

1. synchronous triggers
2. select line
3. number of triggers ... these are really options that we might want to add to most/many tests, so perhaps these should be done in the general way, rather than as a new test-name. The problem is we currently dont have a good way of recording what options were set for that scan.

• note to self - if one gets a scanrequest, then one has access to the actual scan object the api will run. However the same is not true for the TestRequest?, since these generate their own ScanRequest? s on getNextScan :(

New Diagnostic Tests

• DiagnosticTests? (eg binary search of chips and channels)
  • Needs feedback between scan to do as expected, but could have set of 7 scans with channels on if they have bit n set in their address, then 4 scans for chips as well
    • Wouldn't provide full diagnostics on failures which are dependent on neighbours
  • If the configuration setup between Scans was fast enough it would be possible to create a series of scans of one bin with whatever setup you want
    • Having this as a goal changes the configuration strategy again, I think it would require the copy primitive, and setting the mask etc on the ROD, which is not possible at the moment either BJG

• Binary search of chips can be one scan, binary search of channels can be another.
• Start by binary search of chips, all channels enabled, point of failure indicates suspect chip (or lack thereof). This is basically a variant on the RedundancyTest?, but with chips set to return analogue data (eg 4fC Qinj at 2fC threshold).
• Next run binary search of channels for the "bad" chip configuration. Point of failure indicates suspect channel (or lack thereof). This is basically a variant on the NMaskTest, but with chips set to return analogue data (eg 4fC Qinj at 2fC threshold). PWP