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OPEAnalysis

Part of Barrel3Analysis

OPEAnalysis analyses data from the OccupancyPerEvent Data using OPETool.

The cold run data from [Run 2180] Scan 0 now has been analysed. This run is the most complete run for NoiseOccupancyTest since it has complete data from range -40 to +20mV in threshold (relative to TrimTarget). In this data set, 9 modules have been tagged as having "high badness" chips.

New: Run 2180 Scan 0 was taken before this analysis was available. Now the old-analyzed files have been replaced with newly analyzed files and are available on [here on web]. This show the maximum "badness" for a module over all chips.

Here is a list of these modules. In many cases, cross-checking with the Oxford Reception test data and cold test data from module production sites revealed that s-curve dicontinuities had been seen previously. There are two different modes of "badness":

20220040200324  LMT21 z-6   bad at 20mV over 1fC at chip S11  hint of s-curve wiggles at cold test
20220330200353  LMT11 z+6   bad at 15mV over 1fC at chip S12  not previously known to have had s-curve problems

20220380200107  LMT29 z-5   s-curve wiggles at Oxford Reception test
20220380200136  LMT28 z+4   s-curve wiggles at Oxford Reception test
20220380200114  LMT29 z+1   s-curve wiggles at cold test
20220380200081  LMT28 z-5   s-curve wiggles at cold test
20220330200078  LMT26 z+3   s-curve wiggles at cold test
20220170200210  LMT30 z+5   s-curve wiggles at Oxford Reception test
20220040200070  LMT07 z+1   not previously known to have had s-curve problems

The plots for these runs are available at [OPEData]. There are three plots for each module:

Note: NoiseOccupancyTest starts taking data at threshold of 20mV above TrimTarget and then go lower. The following runs aborted often due to data errors at lower thresholds. They are not complete data sets but, they were analyzed for checking the results above.

Analysis of warm runs will follow shortly.

Changes for Barrel 6

Barrel 6 contains lots (and lots) of modules with s-curve wiggles. So with the above criteria, nearly half of the modules on B6 fail the OPEanalysis. So the cuts have been loosened. We want to pick out modules on B6 which have a bad OPE at high thresholds, close to 1fC which will be used for running. Now, thresholds below -20 are not taken into account while calculating badness. Also, there is now a new defect "BAD_OPE" which shows up as PROBLEM=TRUE in the TestResult of NoiseOccupancy?.

Here is a list of OPE related Badnesses on Barrel6 RawScanResult.5874.0.20220380200057.gz : You can see a Badness in Chip 1. This is due to the fact that the PINI got higher when the BOC cooling was turned on. There was data errors on this run as well. This was not reproducible.

RawScanResult.5852.4.20220170200878.gz : shows a High OPE. The test was repeated and the bad OPE was not reproducible.

Barrel 4 summary

9459.7.20220170200659 chip S2 : Noise Occupancy run, LMT16 z-4: One event with 5-9 hits.