00001 /* 00002 * Scans.java 00003 * 00004 * Created on 17 September 2003, 15:21 00005 */ 00006 00007 package Sct; 00008 00013 public final class Scans { 00014 public static final short ELAPSED = 0; 00015 00016 public static final short VTHR = 1; 00017 public static final short VCAL = 2; 00018 public static final short STROBE_DELAY =3; 00019 public static final short PREAMP = 4; 00020 public static final short SHAPER = 5; 00021 00022 public static final short TRIM = 6; /* set trim value of all channels */ 00023 public static final short MASK = 7; /* predefined mask patterns used during testing */ 00024 public static final short ROLE = 8; 00025 public static final short NMASK = 9; /* number of channels to be masked */ 00026 00027 /* 00028 * ABCD3T Config Register Settings 00029 */ 00030 public static final short CAL_MODE = 10; /* calibMode */ 00031 public static final short COMPRESSION = 11; /* readoutMode */ 00032 public static final short TRIM_RANGE = 12; /* trimRange */ 00033 public static final short EDGE_DETECT = 13; /* edgeDetect */ 00034 public static final short SEND_MASK = 14; /* mask */ 00035 public static final short ACCUMULATE = 15; /* accumulate */ 00036 00037 public static final short BYPASS = 17; /* predefined redundancy configurations 00038 to be used during production testing 00039 PWP 01.11.00 */ 00040 public static final short ACTIVE = 18; /* set ACTIVE or INACTIVE */ 00041 00042 public static final short TOKEN = 19; /* a bit pattern that defines the bypass 00043 scheme allowing all combinations. A '1' 00044 means that the chip is read out, a '0' 00045 means that the chip is bypassed/dead */ 00046 00047 /* 00048 * Adjustment of ABCD3T DAC settings using the calibration (RC) data 00049 */ 00050 00051 public static final short QTHR = 41; 00052 public static final short QCAL = 42; 00053 public static final short TARGET = 43; /* Record of Trim Target PWP 06.12.02 */ 00054 public static final short TTHR = 44; /* Threshold in mV set wrt Trim Target PWP 06.12.02 */ 00055 00056 }
1.4.6