Inheritance diagram for DisplayGUI.TestDataInfo:

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Initial value: {"Worst Chip","Chip M0","Chip S1","Chip S2","Chip S3","Chip S4","Chip E5","Chip M8",
"Chip S9","Chip S10","Chip S12","Chip E13"}
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Initial value: {
{},
{},
{0.0,1.0,0.1,0.1},
{0.0,1.0,1.0},
{0.0,1.0,3.0},
{0.0,1.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,200.0,50.0},
{0.0,1.0,4.0,200.0,1.0,100.0,10.0,100.0,20.0,10.0,1.0},
{0.0,1.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,200.0,50.0},
{0.0,1.0,10.0,5e-5,5e-5,200.0},
{0.0,1.0,0.5,0.5},
{},
{},
{0.0,1.0}
}
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Initial value: {
"Reset","Redundancy","FullByPass","Pipeline",
"StrobeDelay","3PtGain","Trim","NPtGain","Noise","TimeWalk","LongTerm","IVscan","NMask"}
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Initial value: {"ResetTest","RedundancyTest","FullBypassTest","PipelineTest",
"StrobeDelayTest","3PtGainTest","TrimRangeTest","NPtGainTest","NoiseOccupancyTest","TimeWalkTest","LongTermTest","IVScanTest","NMaskTest"}
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Initial value: {
{},
{},
{"Result Status","Defect Channels","Token","RToken"},
{"Result Status","Defect Channels","N(bad)"},
{"Result Status","Defect Channels","Delay"},
{"Result Status","Defect Channels","vt50 (mV)","vt50 RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)"},
{"Result Status","Defect Channels","Range","Target","N(untrimmed)","vt50 (mV)","vt50 RMS","Offset (mV)","Offset RMS","Step size (mV)","Step Size RMS"},
{"Result Status","Defect Channels","vt50 (mV)","vt50 RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)"},
{"Result Status","Defect Channels","Offset","Occupancy","RMS Occupancy","Noise (enc)"},
{"Result Status","Defect Channels","TimeWalk","TCal"},
{},
{},
{"Result Status","Defect Channels"}
}
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1.3-rc3