Inheritance diagram for DisplayGUI.TestDataInfo:
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Initial value: {"Worst Chip","Chip M0","Chip S1","Chip S2","Chip S3","Chip S4","Chip E5","Chip M8", "Chip S9","Chip S10","Chip S12","Chip E13"} |
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Initial value: { {}, {}, {0.0,1.0,0.1,0.1}, {0.0,1.0,1.0}, {0.0,1.0,3.0}, {0.0,1.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,200.0,50.0}, {0.0,1.0,4.0,200.0,1.0,100.0,10.0,100.0,20.0,10.0,1.0}, {0.0,1.0,50.0,5.0,10.0,1.0,5.0,3.0,2.0,200.0,50.0}, {0.0,1.0,10.0,5e-5,5e-5,200.0}, {0.0,1.0,0.5,0.5}, {}, {}, {0.0,1.0} } |
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Initial value: { "Reset","Redundancy","FullByPass","Pipeline", "StrobeDelay","3PtGain","Trim","NPtGain","Noise","TimeWalk","LongTerm","IVscan","NMask"} |
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Initial value: {"ResetTest","RedundancyTest","FullBypassTest","PipelineTest", "StrobeDelayTest","3PtGainTest","TrimRangeTest","NPtGainTest","NoiseOccupancyTest","TimeWalkTest","LongTermTest","IVScanTest","NMaskTest"} |
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Initial value: { {}, {}, {"Result Status","Defect Channels","Token","RToken"}, {"Result Status","Defect Channels","N(bad)"}, {"Result Status","Defect Channels","Delay"}, {"Result Status","Defect Channels","vt50 (mV)","vt50 RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)"}, {"Result Status","Defect Channels","Range","Target","N(untrimmed)","vt50 (mV)","vt50 RMS","Offset (mV)","Offset RMS","Step size (mV)","Step Size RMS"}, {"Result Status","Defect Channels","vt50 (mV)","vt50 RMS","Gain (mV/fC)","Gain RMS","Offset (mV)","Offset RMS","Output Noise (mV)","Input Noise (enc)","Noise RMS (enc)"}, {"Result Status","Defect Channels","Offset","Occupancy","RMS Occupancy","Noise (enc)"}, {"Result Status","Defect Channels","TimeWalk","TCal"}, {}, {}, {"Result Status","Defect Channels"} } |