SctData::ISTestSummary::ISNoiseOccupancySummaryWriter Class Reference
Output the result of a NoiseOccupancyTest.
More...
#include <ISNoiseOccupancySummaryWriter.h>
Inheritance diagram for SctData::ISTestSummary::ISNoiseOccupancySummaryWriter:
[legend]Collaboration diagram for SctData::ISTestSummary::ISNoiseOccupancySummaryWriter:
[legend]
|
Public Member Functions |
virtual void | write (const TestResult &t) const |
| override
|
Static Private Attributes |
bool | inMap |
Detailed Description
Output the result of a NoiseOccupancyTest.
Just 12 integers + defects.
Definition at line 13 of file ISNoiseOccupancySummaryWriter.h.
Member Function Documentation
void SctData::ISTestSummary::ISNoiseOccupancySummaryWriter::write |
( |
const TestResult & |
t |
) |
const [virtual] |
|
|
override
Implements SctData::ISTestSummary::ISSummaryWriter.
Definition at line 17 of file ISNoiseOccupancySummaryWriter.cpp.
References Sct::ISUtilities::addOrUpdateOrThrow(), SctData::NoiseOccupancyTestResult::getChipResult(), SctData::TestResult::getHeader(), SctData::ResultHeader::getModuleName(), SctData::ChipNOResult::getNoise(), SctData::ChipNOResult::mean, ISNoiseOccupancySummaryData::noiseByChip, ISNoiseOccupancySummaryData::noiseByChip_size, ISNoiseOccupancySummaryData::occupancyByChip, ISNoiseOccupancySummaryData::occupancyByChip_size, ISNoiseOccupancySummaryData::occupancyRMSByChip, ISNoiseOccupancySummaryData::occupancyRMSByChip_size, SctData::ChipNOResult::offset, ISNoiseOccupancySummaryData::offsetByChip, ISNoiseOccupancySummaryData::offsetByChip_size, SctData::ChipNOResult::rms, and SctData::ISTestSummary::ISSummaryWriter::writeHeader(). |
Here is the call graph for this function:
The documentation for this class was generated from the following files:
Generated on Thu Dec 22 20:22:41 2005 for SCT DAQ/DCS Software - C++ by
1.3.5